Patents by Inventor Steven L. Sikorski

Steven L. Sikorski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5804730
    Abstract: A single operation, multi-task, non-destructive testing technique of ultrasonic examination for defect detection, analysis and sizing. The technique utilizes the same angle, mode of propagation, calibration, set-up, and scanning patterns, for all materials, thickness of materials, and configuration of components for which it is applicable. The technique is used to detect, analyze and size planar flaws, such as fatigue cracks, which are connected to the surface opposite that from which the ultrasound is propagated. The technique relies on the fact that specular reflections received from flaws that have penetration into materials will return to the transducer before reflections which are associated with geometric features of the surface to which the flaw is connected. It also relies on the properties of the longitudinal mode of sound propagation at a 65-75 degree angle resulting in reduced specular reflections from opposite wall geometric reflectors such as weld roots and counterbores.
    Type: Grant
    Filed: October 10, 1995
    Date of Patent: September 8, 1998
    Inventors: Richard A. Pfannenstiel, Steven L. Sikorski