Patents by Inventor Steven M. Balick

Steven M. Balick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6630674
    Abstract: A method and apparatus for correction of temperature-induced variations in the analog output characteristics of a microbolometer detector in an infrared detecting focal plane array utilizing electronic means to correct for the temperature variation of the individual microbolometer detector. The electronic circuitry and associated software necessary for implementation is also described.
    Type: Grant
    Filed: March 13, 2001
    Date of Patent: October 7, 2003
    Assignee: Infrared Components Corporation
    Inventors: Jonathan P. Knauth, Steven M. Balick
  • Patent number: 6610984
    Abstract: A method and apparatus for correction of temperature-induced variations in the analog output characteristics of a microbolometer detector in an infrared detecting focal plane array utilizing electronic means to correct for the temperature variation of the individual microbolometer detector. The electronic circuitry and associated software necessary for implementation is also described.
    Type: Grant
    Filed: March 15, 2001
    Date of Patent: August 26, 2003
    Assignee: Infrared Components Corporation
    Inventors: Jonathan P. Knauth, Steven M. Balick
  • Publication number: 20030146383
    Abstract: A method and apparatus for correction of temperature-induced variations in the analog output characteristics of a microbolometer detector in an infrared detecting focal plane array utilizing electronic means to correct for the temperature variation of the individual microbolometer detector. The electronic circuitry and associated software necessary for implementation is also described.
    Type: Application
    Filed: March 13, 2001
    Publication date: August 7, 2003
    Inventors: Jonathan P. Knauth, Steven M. Balick
  • Publication number: 20010040216
    Abstract: A method and apparatus for correction of temperature-induced variations in the analog output characteristics of a microbolometer detector in an infrared detecting focal plane array utilizing electronic means to correct for the temperature variation of the individual microbolometer detector. The electronic circuitry and associated software necessary for implementation is also described.
    Type: Application
    Filed: March 15, 2001
    Publication date: November 15, 2001
    Inventors: Jonathan P. Knauth, Steven M. Balick