Abstract: A test fixture for electrically testing the opposite sides of a printed circuit board is operative to support the circuit board in a pre-test position in which the board is positioned between and parallel to upper and lower probe structures. The test fixture is provided with a mechanical drive system that selectively functions to downwardly move the supported circuit board and the top probe structure to operative test positions thereof in which electrically conductive probe members on the top and bottom probe structures are brought into operative engagement with test contact points on the top and bottom sides of the circuit board, the probe members being suitably connected to an electrical test and analysis circuit.