Patents by Inventor Steven M. Labovitz

Steven M. Labovitz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240006689
    Abstract: A housing of a battery may be produced to have a reduced flange, such that an interior volume of the housing is increased. The housing may include a can and a cover welded to one another to form a flange of the housing. The cover may be generally planar, and the can may include a curved portion and a planar portion extending from the curved portion. The planar portion may be welded to the cover to form the flange. A weld seam between the can and the cover may begin generally at an end of the planar portion of the can adjacent to the curved portion, and the flange may be cut along or adjacent to the weld seam. In particular, a distance between a transition point of the curved portion of the can and an outermost end of the flange may be less than 300 microns.
    Type: Application
    Filed: April 18, 2023
    Publication date: January 4, 2024
    Inventors: Daeshin Lee, Joshua M. Chien, Rajesh Kandibanda, Aniruddha M. Bhokarikar, Mark E. Wilcox, Seth M. Spaude, Steven M. Labovitz
  • Publication number: 20230092789
    Abstract: Battery systems according to embodiments of the present technology may include a battery including a first electrode terminal and a second electrode terminal accessible along a first surface of the battery. The battery may define a recessed portion of the battery along the first surface of the battery between the first electrode terminal and the second electrode terminal. The battery systems may include a module electrically coupled with the battery. The module may include a circuit board. The module may include a first conductive tab extending from a second surface of the circuit board opposite the first surface of the circuit board. The first conductive tab may be electrically coupling the module with the first electrode terminal. The module may include a second conductive tab extending from the second surface of the circuit board. The second conductive tab may be electrically coupling the module with the second electrode terminal.
    Type: Application
    Filed: September 21, 2021
    Publication date: March 23, 2023
    Applicant: Apple Inc.
    Inventors: Hirotsugu Oba, Brian K. Shiu, Michael P. Zhang, Xiao Liu, Christopher R. Pasma, Steven M. Labovitz, Katharine R. Chemelewski, Erik D. Gillow, Joshua Walter, Junhua Liu, Michael H. Tsai, Stephan P. Abdo
  • Patent number: 8592770
    Abstract: Apparatus and method for transmittance mapping of an object which is at least partially transparent to deep ultraviolet radiation. The method comprises directing a wide-band deep ultraviolet radiation so as to illuminate different areas of an array of successive areas of the object; using an optical detector positioned on an opposite side of the object with respect to the radiation source detecting the wide-band deep ultraviolet radiation that emerges from the object; and processing signals from the optical detector to determine the transmittance of the radiation through the different areas of the array of successive areas of the object.
    Type: Grant
    Filed: July 10, 2008
    Date of Patent: November 26, 2013
    Assignee: Carl Zeiss SMS Ltd.
    Inventors: Guy Ben-Zvi, Eitan Zait, Vladimir J. Dmitriev, Steven M. Labovitz, Erez Graitzer, Ofir Sharoni
  • Publication number: 20110101226
    Abstract: Apparatus and method for transmittance mapping of an object which is at least partially transparent to deep ultraviolet radiation. The method comprises directing a wide-band deep ultraviolet radiation so as to illuminate different areas of an array of successive areas of the object; using an optical detector positioned on an opposite side of the object with respect to the radiation source detecting the wide-band deep ultraviolet radiation that emerges from the object; and processing signals from the optical detector to determine the transmittance of the radiation through the different areas of the array of successive areas of the object.
    Type: Application
    Filed: July 10, 2008
    Publication date: May 5, 2011
    Inventors: Guy Ben-Zvi, Eitan Zait, Vladimir J. Dmitriev, Steven M. Labovitz, Erez Graitzer, Ofir Sharoni
  • Patent number: 7599051
    Abstract: A method for calibration of a substrate inspection tool is disclosed. The tool is used to inspect a standard substrate having simulated contamination defects with known characteristics. Performance of the tool in detecting the simulated contamination defects is determined. The tool exposes the standard substrate and simulated contamination defects to radiation having a wavelength of about 260 nanometers or less. The simulated contamination defects are stable over time under exposure to radiation having a wavelength of about 260 nanometers or less.
    Type: Grant
    Filed: November 21, 2006
    Date of Patent: October 6, 2009
    Assignee: KLA-Tencor Technologies Corporation
    Inventors: Steven M. Labovitz, Weston L. Sousa