Abstract: A graphical user interface (GUI) display and GUI-based system for displaying and controlling vision system operating parameters of a contour sensor comprises an automated region of interest graphic image applied to a discrete region of a selected image in response to a single click by a user at the discrete region of the selected image, the selected image selected from a window on the GUI display containing a plurality of captured images of the object. At least one automated operating parameter is generated automatically in response to the single click by the user at the discrete region of the selected image to determine whether a contour of interest is in the automated ROI graphic image. The GUI also provides a contour graphic image that outlines the contour of interest to demonstrate whether the contour of interest is in (present or at the correct position within) the automated ROI graphic image.

Abstract: This invention provides a Graphical User Interface (GUI) that operates in connection with a machine vision detector or other machine vision system, which provides a highly intuitive and industrial machine-like appearance and layout. The GUI includes a centralized image frame window surrounded by panes having buttons and specific interface components that the user employs in each step of a machine vision system set up and run procedure. One pane allows the user to view and manipulate a recorded filmstrip of image thumbnails taken in a sequence, and provides the filmstrip with specialized highlighting (colors or patterns) that indicate useful information about the underlying images. The programming of logic is performed using a programming window that includes a ladder logic arrangement.

Abstract: A graphical user interface (GUI) display and GUI-based system for displaying and controlling vision system operating parameters of a contour sensor comprises an automated region of interest graphic image applied to a discrete region of a selected image in response to a single click by a user at the discrete region of the selected image, the selected image selected from a window on the GUI display containing a plurality of captured images of the object. At least one automated operating parameter is generated automatically in response to the single click by the user at the discrete region of the selected image to determine whether a contour of interest is in the automated ROI graphic image. The GUI also provides a contour graphic image that outlines the contour of interest to demonstrate whether the contour of interest is in (present or at the correct position within) the automated ROI graphic image.

Abstract: A method of inspecting an image to locate a ball grid array surface-mounted device includes the steps of inspecting the image to find its surface features and to determine their locations (referred to herein as their “observed” locations); comparing expected locations of those features with the observed locations to identify missing surface features; reinspecting the image in the vicinity of apparently missing surface features to verify if the feature is really missing or to find those features and to determine their “observed” locations; and determining, from the observed locations of the surface features, the position and/or angle of the ball grid array surface-mounted device. The invention can be used to determine the position and/or angle of ball grid array surface-mounted devices with surface features in any of many array configurations, e.g., a regular lattice, a checker board lattice, a reverse checker board lattice, a regular lattice with a holes., and a custom lattice.

Abstract: A method of inspecting an image to locate a ball grid array surface-mounted device includes the steps of inspecting the image to find its surface features and to determine their locations (referred to herein as their "observed" locations); comparing expected locations of those features with the observed locations to identify missing surface features; reinspecting the image in the vicinity of apparently missing surface features to verify if the feature is really missing or to find those features and to determine their "observed" locations; and determining, from the observed locations of the surface features, the position and/or angle of the ball grid array surface-mounted device. The invention can be used to determine the position and/or angle of ball grid array surface-mounted devices with surface features in any of many array configurations, e.g., a regular lattice, a checker board lattice, a reverse checker board lattice, a regular lattice with a holes, and a custom lattice.

Abstract: The invention provides a method of testing a machine vision system of the type that inspects a feature (e.g., an electronic component) using object-oriented constructs that instantiate an inspection object from an inspection class that is associated with a type of the feature (e.g., the rectilinear component) and that invoke a method member of that object to inspect the feature to determine its characteristics (e.g., position, angular orientation, and shape conformance). The method of the invention includes the steps of instantiating a test object from a test class that corresponds to the inspection class, invoking a method member of that test object to generate one or more test images representing the feature, inspecting the test images to determine characteristics of the features therein, and reporting results of those inspections.

Abstract: The geometric features of a supported component in a machine for mounting surface mount electronic components are either frontlighted or backlighted for inspection purposes. To backlight the features a fluorescent surface above the component is excited with UV light. Since UV light reflected from the component is invisible to the camera system, the features will appear black with a bright background. To frontlight the features, a light source is used which generates light outside the UV range and a) having a wavelength corresponding to the wavelength of the UV fluorescing surface so that no fluorescent is created or b) having a wavelength substantially different from the UV fluorescing surface that is absorbed by the surface without causing fluorescing to take place. This light when reflected from the features is seen by the camera and the features will appear bright in a dark background.

Abstract: Apparatus for performing a non-contact three-dimensional inspection of a surface-mount component prior to placement on a printed circuit board. Specifically, an arrangement to ensure acceptable alignment (i.e. coplanarity) of all component heads in the XZ or YZ plane, where XY is the plane of the component. The apparatus is embodied within a conventional pick and place machine and performs critical, in-process, lead coplanarity inspection.