Abstract: Various embodiments provide for testing a transmitter with interpolation, which can be used with a circuit for data communications, such as serializer/deserializer (SerDes) communications. In particular, some embodiments provide for data transmission test of a transmitter by: generating and outputting a pre-determined data pattern through a serializer of the transmitter; sampling a serialized data output of the serializer over a plurality of different interpolation phase positions of a phase interpolator; and using a pattern checker to error check the sampled data over the plurality of different interpolation phase positions to determine whether the data transmission test passes.

Abstract: A circuit and method provide a high valued resistance that is ideally used in low bandwidth filter and other signal processing applications. In one embodiment, an active device circuit includes first and second transistors, each having a gate, a source and a drain. The source voltages of the transistors change in response to an input signal voltage on an input terminal, and a current source constrains the gate to source voltages across the first and second transistors thus producing an output signal at an output terminal connected to the gate of the second transistor having a desired output resistance value based on the resistance across the drain and source terminals of the second transistor.