Patents by Inventor Steven Michael Fischer

Steven Michael Fischer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and an ion source for obtaining ions of an analyte
    Patent number: 7855358
    Abstract: A method of obtaining ions of an analyte is disclosed. The method includes aerosolizing a sample using a thermal liquid jetting device or a piezoelectric liquid jetting device to obtain an aerosol without ionizing the sample. The sample includes the analyte in a solvent. The method further includes drying the aerosol to obtain gas phase solvent and gas phase analyte, and ionizing the gas phase analyte to obtain ions thereof. An ion source using the method for obtaining ions of an analyte is also disclosed.
    Type: Grant
    Filed: December 23, 2007
    Date of Patent: December 21, 2010
    Assignee: Agilent Technologies, Inc.
    Inventors: Arthur Schleifer, Steven Michael Fischer
  • Mass spectrometry system having ion deflector
    Patent number: 7633059
    Abstract: A tandem mass spectrometer and method for calibrating a tandem mass spectrometer. The tandem mass spectrometer comprises first and second mass analyzers. The first and second mass analyzers form an ion path. The second mass analyzer is positioned downstream from the first mass analyzer and is arranged to receive ions from the first mass analyzer. An electrode arrangement positioned between the first and second mass analyzers. The electrode assembly is configured to selectively deflect ions from the ion path.
    Type: Grant
    Filed: October 13, 2006
    Date of Patent: December 15, 2009
    Assignee: Agilent Technologies, Inc.
    Inventors: Charles William Russ, IV, Robert Keith Crawford, Steven Michael Fischer
  • METHOD AND AN ION SOURCE FOR OBTAINING IONS OF AN ANALYTE
    Publication number: 20090159794
    Abstract: A method of obtaining ions of an analyte is disclosed. The method includes aerosolizing a sample using a thermal liquid jetting device or a piezoelectric liquid jetting device to obtain an aerosol without ionizing the sample. The sample includes the analyte in a solvent. The method further includes drying the aerosol to obtain gas phase solvent and gas phase analyte, and ionizing the gas phase analyte to obtain ions thereof. An ion source using the method for obtaining ions of an analyte is also disclosed.
    Type: Application
    Filed: December 23, 2007
    Publication date: June 25, 2009
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventors: Arthur SCHLEIFER, Steven Michael FISCHER
  • Mass spectrometry system having ion deflector
    Publication number: 20080087809
    Abstract: A tandem mass spectrometer and method for calibrating a tandem mass spectrometer. The tandem mass spectrometer comprises first and second mass analyzers. The first and second mass analyzers form an ion path. The second mass analyzer is positioned downstream from the first mass analyzer and is arranged to receive ions from the first mass analyzer. An electrode arrangement positioned between the first and second mass analyzers. The electrode assembly is configured to selectively deflect ions from the ion path.
    Type: Application
    Filed: October 13, 2006
    Publication date: April 17, 2008
    Inventors: Charles William Russ, Robert Keith Crawford, Steven Michael Fischer