Abstract: An example memory sub-system includes a memory device and a processing device, operatively coupled to the memory device. The processing device is configured to initialize a block family associated with a memory device; initialize a timeout associated with the block family; initializing a low temperature and a high temperature using a reference temperature at the memory device; responsive to programming a block residing on the memory device, associate the block with the block family; and responsive to at least one of: detecting expiration of the timeout or determining that a difference between the high temperature and the low temperature is greater than or equal to a specified threshold temperature value, close the block family.

Abstract: The testing apparatus facilitates the testing of surfaces for contaminants such as soluble salts prior to applying a protective coating. The testing apparatus includes an air-permeable water-resistant membrane, an overlay, and a test chamber. When assembled, the testing apparatus provides an easily removable testing apparatus that encloses a void into which a solvent may be injected to determine the level of contamination of the surface.

Abstract: The testing apparatus facilitates the testing of surfaces for contaminants such as soluble salts prior to applying a protective coating. The testing apparatus includes an air-permeable water-resistant membrane, an overlay, and a test chamber. When assembled, the testing apparatus provides an easily removable and testing apparatus that encloses a void into which a solvent may be injected to determine the level of contamination of the surface.