Abstract: The I/O circuit of the present invention provides optimal flexibility and performance using a number of different structures and methods. The present invention provides a signal follower circuit for an input pad. In one embodiment, the output buffer is capable of injecting a constant onto a pad during reconfiguration of a configurable system logic circuit. The present invention also provides a circuit for generating a programmable data propagation delay, thereby guaranteeing zero hold time for an arbitrary input register. Zero hold time is accomplished by allowing the user to optimally characterize clock delay to a given input/output circuit. The present invention also provides fast switching between input pads, thereby minimizing data propagation delay between the input pads. Additionally, the present invention reduces time spent in production product test by facilitating the testing of multiple routes with one test configuration.

Abstract: An integrated circuit includes a debugging unit which uses a multi-master general purpose bus within the IC to perform debugging functions. The storage elements of the IC are mapped into the address space of the general purpose bus. The debugging unit can operate as a bus master and read from or write to the storage elements of the integrated circuit directly with the general purpose bus. Thus, the integrated circuit can be rapidly configured for testing and debugging. Furthermore, the debugging unit can work with a breakpoint unit on the IC to detect and analyze specific situations on the IC.

Abstract: The I/O circuit of the present invention provides optimal flexibility and performance using a number of different structures and methods. The present invention provides a signal follower circuit for an input pad. In one embodiment, the output buffer is capable of injecting a constant onto a pad during reconfiguration of a configurable system logic circuit. The present invention also provides a circuit for generating a programmable data propagation delay, thereby guaranteeing zero hold time for an arbitrary input register. Zero hold time is accomplished by allowing the user to optimally characterize clock delay to a given input/output circuit. The present invention also provides fast switching between input pads, thereby minimizing data propagation delay between the input pads. Additionally, the present invention reduces time spent in production product test by facilitating the testing of multiple routes with one test configuration.