Abstract: A benchmark tester retrieves a voltage margin that corresponds to a device that a system includes. The voltage margin indicates an additional amount of voltage to apply to a nominal voltage that, when added, results in the device operating at a power limit while executing a worst-case power workload. Next, the benchmark tester (or thermal power management device) sets an input voltage for the device to a value equal to the sum of the voltage margin and the nominal voltage. The benchmark tester then dynamically benchmark tests the system, which includes adjusting the device's frequency and input voltage while ensuring that the device does not exceed the device's power limit. In turn, the benchmark tester records a guaranteed minimum performance boost for the system based upon a result of the benchmark testing.

Abstract: A method for automatically initializing the operational settings of a system from information stored within a non-volatile storage of an integrated circuit so that the operational requirements of the integrated circuit, which may be a microprocessor, are met by the system when the system is operating. During manufacturing test, environmental requirements of the integrated circuit are determined and stored within the non-volatile storage of the integrated circuit. During system initialization, environmental control values such as required operating voltage and frequency and cooling requirements are determined from the test values, which are read from the integrated circuit. The values are read by an interface of the system from an interface of the integrated circuit. System settings are controlled by the values to provide the required operating environment and the values may be captured within the system for subsequent operations and initialization sequences.

Abstract: A benchmark tester retrieves a voltage margin that corresponds to a device that a system includes. The voltage margin indicates an additional amount of voltage to apply to a nominal voltage that, when added, results in the device operating at a power limit while executing a worst-case power workload. Next, the benchmark tester (or thermal power management device) sets an input voltage for the device to a value equal to the sum of the voltage margin and the nominal voltage. The benchmark tester then dynamically benchmark tests the system, which includes adjusting the device's frequency and input voltage while ensuring that the device does not exceed the device's power limit. In turn, the benchmark tester records a guaranteed minimum performance boost for the system based upon a result of the benchmark testing.

Abstract: A method, computer program product, and a data processing system for maintaining operation of the data processing system in the event of a degraded system cooling condition is provided. A first temperature of a processor is identified as equaling or exceeding a processor throttling threshold. The operational frequency of the processor is reduced by a first frequency increment. The operational voltage of the processor is then reduced by a first voltage increment. Updated values of the processor temperature are periodically obtained and continued reductions in the frequency and operational voltage are made until the temperature indicates that the processor is operating in a stable throttle range. The frequency and operational voltage of the processor may be returned to normal levels when an updated temperature of the processor is less or equal to a throttle off threshold.

Abstract: A method for automatically initializing the operational settings of a system from information stored within a non-volatile storage of an integrated circuit so that the operational requirements of the integrated circuit, which may be a microprocessor, are met by the system when the system is operating. During manufacturing test environmental requirements of the integrated circuit are determined and stored within the non-volatile storage of the integrated circuit. During system initialization, environmental control values such as required operating voltage and frequency and cooling requirements are determined from the test values, which are read from the integrated circuit. The values are read by an interface of the system from an interface of the integrated circuit. System settings are controlled by the values to provide the required operating environment and the values may be captured within the system for subsequent operations and initialization sequences.

Abstract: A method for automatically initializing the operational settings of a system from information stored within a non-volatile storage of an integrated circuit so that the operational requirements of the integrated circuit, which may be a microprocessor, are met by the system when the system is operating. During manufacturing test, environmental requirements of the integrated circuit are determined and stored within the non-volatile storage of the integrated circuit. During system initialization, environmental control values such as required operating voltage and frequency and cooling requirements are determined from the test values, which are read from the integrated circuit. The values are read by an interface of the system from an interface of the integrated circuit. System settings are controlled by the values to provide the required operating environment and the values may be captured within the system for subsequent operations and initialization sequences.

Abstract: A method, computer program product, and a data processing system for maintaining operation of the data processing system in the event of a degraded system cooling condition is provided. A first temperature of a processor is identified as equaling or exceeding a processor throttling threshold. The operational frequency of the processor is reduced by a first frequency increment. The operational voltage of the processor is then reduced by a first voltage increment. Updated values of the processor temperature are periodically obtained and continued reductions in the frequency and operational voltage are made until the temperature indicates that the processor is operating in a stable throttle range. The frequency and operational voltage of the processor may be returned to normal levels when an updated temperature of the processor is less or equal to a throttle off threshold.

Abstract: An apparatus and method for expansion of an inter-IC (I2C) is provided. An expansion processor resides on a primary I2C bus. The expansion processor is coupled to a plurality of I2C sub-buses each of which may host a plurality of I2C devices. Data is transferred between the expansion processor and the plurality of I2C devices via the corresponding sub-bus according to an I2C protocol. Data transfer is in response to a request initiated by a bus master on the primary I2C bus. The bus master communicates with a target device residing on one of the sub-buses by addressing the expansion processor. The bus master informs the expansion processor of the target device by sending the expansion processor a number of the sub-bus on which the target device resides, and an address of the target device. A data stream bound for the target device is directed to the expansion processor which the echos it to the target device.

Abstract: A burst transfer alignment apparatus and method are provided. An interface between the word-aligned subsystem and the double-word-aligned system bus loads a predetermined invalid bit pattern on the system bus corresponding to the second word of the double-word access, in response to a misaligned read. When execution of the predetermined invalid pattern is attempted, an execution exception is thrown. In response the cache line containing the invalid pattern giving rise to the exception is invalidated at the address of the invalid instruction data. Returning from the exception to the address of the invalid pattern, the cache line is refetched. The refetch occurs on an even word boundary, and therefore the refetched cache line transfers properly because the even word address coincides with a double word boundary expected by the bus system.

Abstract: One aspect of the invention relates to an apparatus for detecting environmental faults in a computer system. In one version of the invention, the apparatus includes a means for measuring a physical parameter with a sensor coupled to the computer system, the sensor being associated with a sensor type and identification code; a means for transmitting a signal from the sensor to the computer system, the signal being responsive to the measurement; a means for determining whether an environmental fault condition exists by comparing the signal to a pre-determined threshold; means for determining an error type, identification code and sensor type; and a means for writing fault data to an environmental warning register, the fault data comprising the sensor type, identification code and error type.

Abstract: A programmable logic cell has four cell input nodes and a plurality of combinational logic circuits. Four inverter circuits are provided for programmably inverting respective input logic signals, each inverter circuit having an inverter input node connected to a respective cell input node for accepting its respective input logic signal therefrom. Each inverter is programmable into a first state wherein a logic signal representing the complement of the input logic signal is provided to the inverter output node, and a second state wherein a logic signal representing the non-complement of the input logic signal is provided to the inverter output node. The inverter circuits buffer their input logic signals in both their first and second states.

Abstract: In a Field Programmable Gate Array ("FPGA") design system, a configuration is generated. A path of the configuration is selected as a critical path for optimization. The critical path is optimized by rerouting connections between the logical primitives of the critical path. Prior to the rerouting, the logical primitives of the critical path may be optimally placed within the FPGA configuration. Optimal performance of the critical path is thus achieved.

Abstract: A computer implemented method for the automated placement and routing in the design of field programmable gate arrays achieves optimal timing. In a library of primitives and macros from which a designer may choose to implement a given circuit design, at least some of said macros are "semi-hard" macros where direct connections and relative placements are specified while local bus routing is requested in a manner that does not restrict macro placement. A logical netlist containing references to macros and how to connect them together to perform a logical function is first created. The logical netlist is then translated to a physical netlist using a mapper function. This physical netlist for the semi-hard macros specifies what is to be connected but not how. The best place to put each macro on the field programmable gate array is found using a placer function. The placer function thus determines an absolute position of the macros. Pre-defined macro direct connections are routed using a router function.

Abstract: A programmable logic cell has four logic gates, two of which are configurable. The two configurable logic gates are positioned near the logic cell inputs. Each configurable logic gate has two inputs, each input being connected to one of the four logic cell inputs. The remaining two logic gates receive the outputs of the configurable logic gates. Four independent logic cell input nodes are provided, each having associated therewith a programmable input multiplexer. Each input multiplexer can have inputs connected to at least two types of interconnect conductors. The cell also has two output paths, each having associated therewith an independently-controlled output multiplexer. The output of each output multiplexer is connected to an input of the other output multiplexer. Additional features include a multiplexer having inputs connected to two cell input nodes, a select input connected to a third logic cell input node, and an output connected to a cell output node; a system low-skew data (e.g.

Abstract: A programmable logic cell has four logic gates, two of which are configurable. The two configurable logic gates are positioned near the logic cell inputs. Each configurable logic gate has two inputs, each input being connected to one of the four logic cell inputs. The remaining two logic gates receive the outputs of the configurable logic gates. Four independent logic cell input nodes are provided, each having associated therewith a programmable input multiplexer. Each input multiplexer can have inputs connected to at least two types of interconnect conductors. The cell also has two output paths, each having associated therewith an independently-controlled output multiplexer. The output of each output multiplexer is connected to an input of the other output multiplexer. Additional features include a multiplexer having inputs connected to two cell input nodes, a select input connected to a third logic cell input node, and an output connected to a cell output node; a system low-skew data (e.g.