Patents by Inventor Steven Perry Sturm

Steven Perry Sturm has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7301164
    Abstract: A measuring apparatus is provided having an illumination unit including a source of electromagnetic radiation, fiber optic apparatus and sensing apparatus. The fiber optic apparatus includes first fiber optic structure having an input end for receiving at least a portion of electromagnetic radiation emitted from the radiation source and an output end for directing the received radiation to a web of material, and second fiber optic structure having an input end for receiving radiation reflected from the web of material and an output end for directing the reflected radiation to the sensing apparatus. The sensing apparatus includes a first detector for sensing electromagnetic radiation of a first wavelength band and generating a corresponding first output signal and a second detector for sensing electromagnetic radiation of a second wavelength band and generating a corresponding second output signal indicative of a first property to be measured of the web of material.
    Type: Grant
    Filed: January 30, 2004
    Date of Patent: November 27, 2007
    Assignee: ABB Inc.
    Inventors: Dennis Charles Daugherty, Rodney Dale Maxson, Steven Perry Sturm
  • Patent number: 7005639
    Abstract: Beta gauge composition correction is performed using signals from a plurality of detectors that are positioned so that the ratio of radiation received by the detectors depends on the composition of material through which the radiation passes before reaching the detectors. Radiation is measured at the detectors and the differences between radiation received by the detectors is used to compensate the beta gauge to correct for composition variations. An array of detectors is divided into inner detectors generally aligned with the central portion of a beta radiation beam and at least one set of outer detectors surrounding, at least in part, the inner detectors. Measurements are made including all the detectors, the inner detectors and the at least one set of outer detectors with the difference between the measurements made by the inner detectors and the outer detectors being used to compensate the total measurement made by all the detectors.
    Type: Grant
    Filed: July 28, 2003
    Date of Patent: February 28, 2006
    Assignee: ABB Inc.
    Inventor: Steven Perry Sturm
  • Patent number: 6960769
    Abstract: A single vane shutter flag is asynchronously controlled so that a measuring system light source is interrupted for a minimum necessary amount of time for standardization/calibration and normalization of InGaAs system detectors. Source/detector hemispheres or serially connected randomly oriented fiber bundles homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controlling the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.
    Type: Grant
    Filed: October 3, 2002
    Date of Patent: November 1, 2005
    Assignee: ABB Inc.
    Inventors: Gary Neil Burk, Thomas Michael Domin, Rodney Dale Maxson, Dennis Charles Daugherty, Steven Perry Sturm
  • Publication number: 20040065829
    Abstract: A single vane shutter flag is asynchronously controlled so that a measuring system light source is interrupted for a minimum necessary amount of time for standardization/calibration and normalization of InGaAs system detectors. Source/detector hemispheres or serially connected randomly oriented fiber bundles homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controlling the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.
    Type: Application
    Filed: October 3, 2002
    Publication date: April 8, 2004
    Inventors: Gary Neil Burk, Thomas Michael Domin, Rodney Dale Maxson, Dennis Charles Daugherty, Steven Perry Sturm
  • Patent number: 6377652
    Abstract: A method and system for on-line measurements of mineral additives in or on a paper web utilizing shaped spectrum x-rays and solid-state PIN detectors. Each of three detectors are cover by a filter used to shape the spectrums of x-rays received by the detectors. The filters are selected to maximize sensitivity differences between detectors for the desired detectable mineral additives. A computer processes signals from the detectors and from basis weight and moisture measuring instruments to determine total mineral content, and the individual amounts of mineral additives in or on (e.g. coating) the paper web.
    Type: Grant
    Filed: January 5, 2000
    Date of Patent: April 23, 2002
    Assignee: ABB Automation Inc.
    Inventor: Steven Perry Sturm