Patents by Inventor Steven R. Higgins

Steven R. Higgins has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Hyperbaric hydrothermal atomic force microscope
    Patent number: 6586734
    Abstract: A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100° C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.
    Type: Grant
    Filed: June 28, 2002
    Date of Patent: July 1, 2003
    Assignee: The Regents of the University of California
    Inventors: Kevin G. Knauss, Carl O. Boro, Steven R. Higgins, Carrick M. Eggleston
  • Hyperbaric hydrothermal atomic force microscope
    Publication number: 20020162960
    Abstract: A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100° C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.
    Type: Application
    Filed: June 28, 2002
    Publication date: November 7, 2002
    Applicant: The Regents of the University of California
    Inventors: Kevin G. Knauss, Carl O. Boro, Steven R. Higgins, Carrick M. Eggleston
  • Hyperbaric hydrothermal atomic force microscope
    Patent number: 6437328
    Abstract: A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100° C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.
    Type: Grant
    Filed: August 3, 1999
    Date of Patent: August 20, 2002
    Assignee: The Regents of the University of California
    Inventors: Kevin G. Knauss, Carl O. Boro, Steven R. Higgins, Carrick M. Eggleston