Patents by Inventor Steven R. Ulrich

Steven R. Ulrich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Time-of-flight mass spectrometry of surfaces
    Patent number: 8519329
    Abstract: The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.
    Type: Grant
    Filed: December 16, 2011
    Date of Patent: August 27, 2013
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Steven R. Ulrich, Kelley L. Waters
  • Fast time-of-flight mass spectrometer with improved data acquisition system
    Patent number: 8492710
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Grant
    Filed: September 17, 2010
    Date of Patent: July 23, 2013
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven R. Ulrich
  • TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACE
    Publication number: 20120085898
    Abstract: The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.
    Type: Application
    Filed: December 16, 2011
    Publication date: April 12, 2012
    Inventors: Thomas F. Egan, J. Albert Schultz, Steven R. Ulrich, Kelley L. Waters
  • Time-of-flight mass spectrometry of surfaces
    Patent number: 8101909
    Abstract: The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.
    Type: Grant
    Filed: January 26, 2009
    Date of Patent: January 24, 2012
    Assignee: Ionwerks, Inc.
    Inventors: Thomas F. Egan, J. Albert Schultz, Steven R. Ulrich, Kelley L. Waters
  • Fast time-of-flight mass spectrometer with improved dynamic range
    Patent number: 7800054
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Grant
    Filed: April 25, 2008
    Date of Patent: September 21, 2010
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven R. Ulrich
  • TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACES
    Publication number: 20090189072
    Abstract: The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.
    Type: Application
    Filed: January 26, 2009
    Publication date: July 30, 2009
    Applicant: Ionwerks, Inc.
    Inventors: Thomas F. Egan, J. Albert Schultz, Steven R. Ulrich, Kelley L. Waters
  • FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DYNAMIC RANGE
    Publication number: 20090008545
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Application
    Filed: April 25, 2008
    Publication date: January 8, 2009
    Applicant: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven R. Ulrich