Patents by Inventor Steven Rogacki

Steven Rogacki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8536879
    Abstract: A compact instrument package consisting of a rotating sensor and supporting signal-processing electronics is capable of measuring two-dimensional electric-field vectors, ranging from DC to an arbitrary upper AC frequency not limited by the rotation rate, with highly improved accuracy and sensitivity when compared with previous art. In addition, contrary to previous art, the sensor can measure the electric field gradient at its location. This is achieved by the use of a combination of quadrature modulation and phase-sensitive quadrature demodulation digital signal processing in a generic rotating electric-field sensor. Ground isolated versions of the instrument can be used singly or in arrays when precise measurements of the electric fields are necessary. Either grounded or isolated versions of the instrument can operate continuously without the need for internal batteries, making it extremely attractive for a wide-range of industrial and space applications.
    Type: Grant
    Filed: June 2, 2009
    Date of Patent: September 17, 2013
    Assignee: The Regents of The University of Michigan
    Inventors: Nilton O. Renno, Steven A. Rogacki
  • Patent number: 8219346
    Abstract: Various techniques are described for high resolution time measurement using a programmable device, such as a field programmable gate array (FPGA). The timing may be triggered by any event, depending on the applications of use. Once triggering has occurred, a START pulse begins propagating through the FPGA. The pulse is able to propagate through the FPGA in a staggered manner traversing multiple FPGA columns to maximize the amount of time delay that may be achieved while minimizing the overall array size, and thus minimizing the resource utilization, of the FPGA. The FPGA timing delay is calibrated by measuring for the linear and non-linear differences in delay time of each unit circuit forming the staggered delay line path for the timing circuit. The FPGA is able to achieve nanosecond and sub-nanosecond time resolutions.
    Type: Grant
    Filed: June 16, 2011
    Date of Patent: July 10, 2012
    Assignee: The Regents of the University of Michigan
    Inventors: Thomas Zurbuchen, Steven Rogacki
  • Publication number: 20110255380
    Abstract: Various techniques are described for high resolution time measurement using a programmable device, such as an FPGA. The timing may be triggered by any event, depending on the applications of use. Once triggering has occurred, a START pulse begins propagating through the FPGA. The pulse is able to propagate through the FPGA in a staggered manner traversing multiple FPGA columns to maximize the amount of time delay that may be achieved while minimizing the overall array size, and thus minimizing the resource utilization, of the FPGA. The FPGA timing delay is calibrated by measuring for the linear and non-linear differences in delay time of each unit circuit forming the staggered delay line path for the timing circuit. The FPGA is able to achieve nanosecond and sub-nanosecond time resolutions and thus may be used in applications such as various time of flight systems.
    Type: Application
    Filed: June 16, 2011
    Publication date: October 20, 2011
    Applicant: The Regents of the University of Michigan
    Inventors: Thomas Zurbuchen, Steven Rogacki
  • Patent number: 7979228
    Abstract: Various techniques are described for high resolution time measurement using a programmable device, such as an FPGA. The timing may be triggered by any event, depending on the applications of use. Once triggering has occurred, a START pulse begins propagating through the FPGA. The pulse is able to propagate through the FPGA in a staggered manner traversing multiple FPGA columns to maximize the amount of time delay that may be achieved while minimizing the overall array size, and thus minimizing the resource utilization, of the FPGA. The FPGA timing delay is calibrated by measuring for the linear and non-linear differences in delay time of each unit circuit forming the staggered delay line path for the timing circuit. The FPGA achieves nanosecond and sub-nanosecond time resolutions and is used in applications such as various time of flight systems.
    Type: Grant
    Filed: July 21, 2008
    Date of Patent: July 12, 2011
    Assignee: The Regents of the University of Michigan
    Inventors: Thomas Zurbuchen, Steven Rogacki
  • Publication number: 20110062968
    Abstract: A compact instrument package consisting of a rotating sensor and supporting signal-processing electronics is capable of measuring two-dimensional electric-field vectors, ranging from DC to an arbitrary upper AC frequency not limited by the rotation rate, with highly improved accuracy and sensitivity when compared with previous art. In addition, contrary to previous art, the sensor can measure the electric field gradient at its location. This is achieved by the use of a combination of quadrature modulation and phase-sensitive quadrature demodulation digital signal processing in a generic rotating electric-field sensor. Ground isolated versions of the instrument can be used singly or in arrays when precise measurements of the electric fields are necessary. Either grounded or isolated versions of the instrument can operate continuously without the need for internal batteries, making it extremely attractive for a wide-range of industrial and space applications.
    Type: Application
    Filed: June 2, 2009
    Publication date: March 17, 2011
    Inventors: Nilton O. Renno, Steven A. Rogacki
  • Publication number: 20090125263
    Abstract: Various techniques are described for high resolution time measurement using a programmable device, such as an FPGA. The timing may be triggered by any event, depending on the applications of use. Once triggering has occurred, a START pulse begins propagating through the FPGA. The pulse is able to propagate through the FPGA in a staggered manner traversing multiple FPGA columns to maximize the amount of time delay that may be achieved while minimizing the overall array size, and thus minimizing the resource utilization, of the FPGA. The FPGA timing delay is calibrated by measuring for the linear and non-linear differences in delay time of each unit circuit forming the staggered delay line path for the timing circuit. The FPGA is able to achieve nanosecond and sub-nanosecond time resolutions and thus may be used in applications such as various time of flight systems.
    Type: Application
    Filed: July 21, 2008
    Publication date: May 14, 2009
    Applicant: THE REGENTS OF THE UNIVERSITY OF MICHIGAN
    Inventors: Thomas Zurbuchen, Steven Rogacki
  • Patent number: 6481939
    Abstract: A tool tip conductivity sensor and method for determining when a tool tip of a machine contacts a workpiece. The sensor has at least two external connectors, one to the workpiece and the other to the machine. When the tool tip grazes the workpiece surface an electrical circuit is completed. The signal from the contacts is supplied to a trigger circuit, which preferably compares the signal to a DC offset. The trigger signal from the trigger circuit is supplied to a notification circuit, which provides a signal indicating contact. Preferably, the notification circuit receives the trigger signal and provides a steady “On” condition for an LED or activates an audible device, such as a piezoelectric transducer. The notification circuit can also provide a reference for further machining to a controller of the machine using the sensor as a contact probe.
    Type: Grant
    Filed: August 24, 2001
    Date of Patent: November 19, 2002
    Inventors: Robb S. Gillespie, Steven A. Rogacki
  • Patent number: 5079502
    Abstract: Proximity sensors for detecting the presence of metal objects such as sheet metal workpieces within workpiece engaging devices such as grippers and shovels. The proximity sensors are jacketed in a stainless steel casing, making them rugged and resistant to impact damage. Monitor circuits are used with the sensor which enable the devices to sense objects through their metal casing, these objects being disposed upon the sensor casing. A thresholding circuit and a delay circuit are further disclosed and which reduce erroneous indications of the presence of the metal objects upon the sensor. Other embodiments are disclosed which allow for the proper alignment of metallic workpieces within an area and for the determination of the height of a stack of workpieces.
    Type: Grant
    Filed: March 2, 1990
    Date of Patent: January 7, 1992
    Assignee: Syron Engineering & Manufacturing Corporation
    Inventors: Steven A. Rogacki, Alfred F. Herbermann
  • Patent number: 4906926
    Abstract: Proximity sensors for detecting the presence of metal objects such as sheet metal workpieces within workpiece engaging devices such as grippers and shovels. The proximity sensors are jacketed in a stainless steel casing, making them rugged and resistant to impact damage. Monitor circuits are used with the sensor which enable the devices to sense objects through their metal casing.
    Type: Grant
    Filed: May 16, 1988
    Date of Patent: March 6, 1990
    Assignee: Syron Engineering & Manufacturing Corporation
    Inventors: Steven A. Rogacki, Robert M. Carabbio, Alfred F. Herbermann