Abstract: A computer input system includes a mouse including a housing having an interior surface defining an internal volume and a sensor assembly disposed in the internal volume. A processor is electrically coupled to the sensor assembly and a memory component having electronic instructions stored thereon that, when executed by the processor, causes the processor to determine an orientation of the mouse relative to a hand based on a touch input from the hand detected by the sensor assembly. The mouse can also have a circular array of touch sensors or lights that detect hand position and provide orientation information to the user.

Abstract: A computer system can include an input device having a housing defining an internal volume. The housing can include a grip portion and a base portion defining an aperture. The computer system can also include a tilt sensor disposed in the internal volume, a position sensor disposed at the aperture, and a processor. The processor can be electrically coupled to the position sensor, the tilt sensor, and a memory component storing electronic instructions that, when executed by the processor, cause the processor to receive a first input from the tilt sensor, receive a second input from the position sensor, determine, based on the first and second inputs, if the base is in contact with a support surface and an angle of the base relative to the support surface. The processor can also output a signal based on the angle if the base is in contact with the support surface.

Abstract: An input device, such as a mouse, can include a housing defining an exterior grip portion and an internal volume, a sensor assembly disposed in the internal volume, and an emitter electrically coupled to the sensor assembly. In response to the sensor assembly detecting a first touch input on the housing, the emitter sends a first signal including information regarding an angular position of the grip portion. In response to the sensor assembly detecting a second touch input on the housing, the emitter sends a second signal including information regarding a direction of a force exerted on the housing from the second touch input.

Abstract: A process for measuring strain is provided that includes placing a sample of a material into a TEM as a sample. The TEM is energized to create a small electron beam with an incident angle to the sample. Electrical signals are generated that control multiple beam deflection coils and image deflection coils of the TEM. The beam deflection control signals cause the angle of the incident beam to change in a cyclic time-dependent manner. A first diffraction pattern from the sample material that shows dynamical diffraction effects is observed and then one or more of the beam deflection coil control signals are adjusted to reduce the dynamical diffraction effects. One or more of the image deflection coil control signals are then adjusted to remove any motion of the diffraction pattern.

Abstract: A process for measuring strain is provided that includes placing a sample of a material into a TEM as a sample. The TEM is energized to create a small electron beam with an incident angle to the sample. Electrical signals are generated that control multiple beam deflection coils and image deflection coils of the TEM. The beam deflection control signals cause the angle of the incident beam to change in a cyclic time-dependent manner. A first diffraction pattern from the sample material that shows dynamical diffraction effects is observed and then one or more of the beam deflection coil control signals are adjusted to reduce the dynamical diffraction effects. One or more of the image deflection coil control signals are then adjusted to remove any motion of the diffraction pattern.