Abstract: An automated test system for testing a device under test includes a storage device, an input device, a processor, and a test apparatus. The storage device is operable to store a plurality of sets of test parameters, and is further operable to store a plurality of product model identifiers, each product model identifier associated with one of the plurality of sets of test parameters. The input device is operable to obtain input from an operator defining a first product model identifier from the plurality of product model identifiers. The processor is coupled to the input device and the storage device and is operable to receive the input from the input device and retrieve the set of test parameters associated with the first product model identifier from the storage device based on the input. The processor is further operable to generate a control signal that includes the retrieved set of test parameters.

Abstract: An automated test system for testing a device having a circuit connection and a ground connection includes a processor, a test apparatus, and a discharge circuit. The processor is operable to generate a control signal that includes a set of test parameters, and is further operable to generate a discharge control signal upon completion of a test. The test apparatus includes a first connection operable to be connected to the circuit connection of the device and a second connection operable to be connected to the ground connection of the device. The test apparatus is also operably connected to receive the control signal including the set of test parameters from the processor. The test apparatus is operable to perform a first test based on the set of test parameters. The discharge circuit is external to the test apparatus and is coupled to the processor. The discharge circuit is operable to be coupled to the ground connection and the circuit connection of the device.