Patents by Inventor Steven Wylie Mitchell

Steven Wylie Mitchell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Real-time analysis and control of electron beam manufacturing process through x-ray computed tomography
    Patent number: 10113981
    Abstract: Electron beam manufacturing processes, and systems that perform the processes, are described that utilize real-time analysis and control of the electron beam manufacturing processes by detecting secondary x-rays that are generated as a result of the electron beam contacting a workpiece. The detected secondary x-rays are used to generate, in real-time, a three-dimensional cross-sectional image of the portion or region of the workpiece surrounding the location contacted by the electron beam. In addition, real-time analysis of the three-dimensional cross-sectional image can be used to detect defects and real-time re-work or correction of defects can be performed by directing an electron beam back to an area with a defect.
    Type: Grant
    Filed: July 15, 2016
    Date of Patent: October 30, 2018
    Assignee: Lockheed Martin Corporation
    Inventor: Steven Wylie Mitchell
  • REAL-TIME ANALYSIS AND CONTROL OF ELECTRON BEAM MANUFACTURING PROCESS THROUGH X-RAY COMPUTED TOMOGRAPHY
    Publication number: 20170023499
    Abstract: Electron beam manufacturing processes, and systems that perform the processes, are described that utilize real-time analysis and control of the electron beam manufacturing processes by detecting secondary x-rays that are generated as a result of the electron beam contacting a workpiece. The detected secondary x-rays are used to generate, in real-time, a three-dimensional cross-sectional image of the portion or region of the workpiece surrounding the location contacted by the electron beam. In addition, real-time analysis of the three-dimensional cross-sectional image can be used to detect defects and real-time re-work or correction of defects can be performed by directing an electron beam back to an area with a defect.
    Type: Application
    Filed: July 15, 2016
    Publication date: January 26, 2017
    Inventor: Steven Wylie Mitchell