Abstract: A system includes a bacteria culture array that includes a plurality of chambers each configured to receive a portion of a sample that includes bacteria. Each individual chamber of the plurality of chambers includes a chamber opening configured to permit access of the portion of the sample to the individual chamber. The system also includes one or more sensors configured to collect data from the individual chamber. The sensors are configured to contact the sample. Additionally, the system includes a monitoring and analysis system that includes a processor configured to receive the data from the one or more sensors at a first time and a second time, compare the data received at the second time to the data received at the first time, and identify a portion of the plurality of chambers of the bacteria culture array based on the comparing.

Abstract: A true time delay (TTD) module includes a substrate and a transmission line formed on the substrate. The transmission line includes time delay lines that define signal paths of varying lengths between a signal input and a signal output of the TTD module. A plurality of switching elements are positioned along the transmission line and are selectively controllable to define a signal transmission path between the signal input and the signal output. The switching elements include an input switching element positioned at a first end of each of the plurality of time delay lines, an output switching element positioned at a second end of each of the plurality of time delay lines, and at least one intermediate switching element positioned between the input switching element and the output switching element of at least one of the plurality of time delay lines.

Abstract: A sensing system for monitoring an industrial fluid is presented. The sensing system includes a housing and a sensor probe disposed at least partially in the housing, where the sensor probe includes a substrate, a sensing region disposed on the substrate, a first coil disposed on the substrate and coupled to the sensing region, and a second coil disposed on the substrate and coupled to the first coil. A method for operating the sensing system is also presented.

Abstract: A system includes a bacteria culture array that includes a plurality of chambers each configured to receive a portion of a sample that includes bacteria. Each individual chamber of the plurality of chambers includes a chamber opening configured to permit access of the portion of the sample to the individual chamber. The system also includes one or more sensors configured to collect data from the individual chamber. The sensors are configured to contact the sample. Additionally, the system includes a monitoring and analysis system that includes a processor configured to receive the data from the one or more sensors at a first time and a second time, compare the data received at the second time to the data received at the first time, and identify a portion of the plurality of chambers of the bacteria culture array based on the comparing.

Abstract: A true time delay (TTD) module includes a substrate and a transmission line formed on the substrate. The transmission line includes time delay lines that define signal paths of varying lengths between a signal input and a signal output of the TTD module. A plurality of switching elements are positioned along the transmission line and are selectively controllable to define a signal transmission path between the signal input and the signal output. The switching elements include an input switching element positioned at a first end of each of the plurality of time delay lines, an output switching element positioned at a second end of each of the plurality of time delay lines, and at least one intermediate switching element positioned between the input switching element and the output switching element of at least one of the plurality of time delay lines.

Abstract: A sensing system for monitoring an industrial fluid is presented. The sensing system includes a housing and a sensor probe disposed at least partially in the housing, where the sensor probe includes a substrate, a sensing region disposed on the substrate, a first coil disposed on the substrate and coupled to the sensing region, and a second coil disposed on the substrate and coupled to the first coil. A method for operating the sensing system is also presented.

Abstract: A sensing system includes an inductor-capacitor-resistor (LCR) resonator sensor having a substrate, a plurality of first sensing elements mutually spaced apart and disposed on the substrate, and a sensing material film being disposed on a first sensing region of the corresponding first sensing element.

Abstract: A sensing system includes an inductor-capacitor-resistor (LCR) resonator sensor having a substrate, a plurality of first sensing elements mutually spaced apart and disposed on the substrate, and a sensing material film being disposed on a first sensing region of the corresponding first sensing element.

Abstract: A micro-electromechanical system (MEMS) device that in one embodiment includes at least two MEMS switches coupled to each other in a back-to-back configuration. The first and second suspended elements corresponding to first and second MEMS switches are electrically coupled. Further, first and second contacts corresponding to the first and second MEMS switches are configured such that a differential voltage between the second suspended element and the second contact is approximately equal to a differential voltage between the first suspended element and the first contact. The MEMS device includes at least one actuator coupled to one or more of the first and second suspended elements to actuate one or more of the first and the second suspended elements. In one example, the MEMS device includes one or more passive elements coupled to one or more of the first and second MEMS switches.

Abstract: A sensing system includes an inductor-capacitor-resistor (LCR) resonator sensor having a substrate, a plurality of first sensing elements mutually spaced apart and disposed on the substrate, and a sensing material film being disposed on a first sensing region of the corresponding first sensing element.

Abstract: A micro-electromechanical system (MEMS) device that in one embodiment includes at least two MEMS switches coupled to each other in a back-to-back configuration. The first and second suspended elements corresponding to first and second MEMS switches are electrically coupled. Further, first and second contacts corresponding to the first and second MEMS switches are configured such that a differential voltage between the second suspended element and the second contact is approximately equal to a differential voltage between the first suspended element and the first contact. The MEMS device includes at least one actuator coupled to one or more of the first and second suspended elements to actuate one or more of the first and the second suspended elements. In one example, the MEMS device includes one or more passive elements coupled to one or more of the first and second MEMS switches.

Abstract: A method for measuring a proximity of a component with respect to an emitter is provided. The method includes transmitting at least one microwave signal having a plurality of frequency components within a predefined frequency range to the emitter. At least one electromagnetic field is generated by the emitter from the microwave signal. A load is then induced to the emitter by an interaction between the component and the electromagnetic field, wherein at least one loading signal representative of the loading is reflected within a data conduit from the emitter. Moreover, the loading signal is received by at least one signal processing device. The proximity of the component with respect to the emitter is measured by the signal processing device based on the loading signal.

Abstract: A method for measuring a proximity of a component with respect to a microwave emitter is provided. The method comprises transmitting at least one microwave signal to the microwave emitter. At least one electromagnetic field is generated by the microwave emitter from the microwave signal. Moreover, the method comprises inducing a loading to the microwave emitter by an interaction between the component and the electromagnetic field, wherein at least one detuned loading signal representative of the loading is reflected within a data conduit from the microwave emitter. The detuned loading signal is received by at least one signal processing device. The signal processing device then measures the proximity of the component with respect to the microwave emitter based on the loading signal. An electrical output is generated by the signal processing device.