Patents by Inventor Stopjakova Viera

Stopjakova Viera has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for testing electronic devices
    Patent number: 6859058
    Abstract: Test circuitry and test methods performing supply current measurement is presented. The test circuitry can be but is not limited to be on-chip. The supply current, also denoted test current, can be transient. The test circuitry and methods do not cause additional power supply voltage degradation. The test circuitry and methods provide detection capabilities for open defects, causing significant reduction of the transient supply current.
    Type: Grant
    Filed: September 30, 2002
    Date of Patent: February 22, 2005
    Assignee: Interuniversitair Microelektronica Centrum (IMEC UZW)
    Inventors: Hans Manhaeve, Stopjakova Viera
  • Method and apparatus for testing electronic devices
    Publication number: 20030062916
    Abstract: Test circuitry and test methods performing supply current measurement is presented. The test circuitry can be but is not limited to be on-chip. The supply current, also denoted test current, can be transient. The test circuitry and methods do not cause additional power supply voltage degradation. The test circuitry and methods provide detection capabilities for open defects, causing significant reduction of the transient supply current.
    Type: Application
    Filed: September 30, 2002
    Publication date: April 3, 2003
    Applicant: Interuniversitair Micro-Elektronica Centrum, vzw
    Inventors: Hans Manhaeve, Stopjakova Viera
  • Method and apparatus for testing electronic devices
    Patent number: 6496028
    Abstract: Test circuitry and test methods performing supply current measurement is presented. The test circuitry can be but is not limited to be on-chip. The supply current, also denoted test current, can be transient. The test circuitry and methods do not cause additional power supply voltage degradation. The test circuitry and methods provide detection capabilities for open defects, causing significant reduction of the transient supply current.
    Type: Grant
    Filed: May 9, 2000
    Date of Patent: December 17, 2002
    Assignees: Interuniversitair Micro-Elektronica Centrum, Katholieke Hogeschool Brugge-Oostende (KHBO)
    Inventors: Hans Manhaeve, Stopjakova Viera