Abstract: A first aspect of the invention provides an apparatus to indicate an amplitude of an uneven measurement surface. The apparatus may include a frame slidingly supporting a set of pins, each pin including a high point stop and a low point stop; a low point isolator member moveable relative to the frame, the low point isolator member indicating a lowest point of the uneven measurement surface by a respective low point stop of a first; a high point isolator member moveable relative to the frame, the high point isolator member indicating a highest point of the uneven measurement surface by a respective high point stop of a second pin; a low point displacement sensor for identifying a low point displacement; a high point displacement sensor for identifying a high point displacement; and a calculator for calculating a difference between the low point displacement and the high point displacement.

Abstract: A first aspect of the invention provides an apparatus to indicate an amplitude of an uneven measurement surface. The apparatus may include a frame slidingly supporting a set of pins, each pin including a high point stop and a low point stop; a low point isolator member moveable relative to the frame, the low point isolator member indicating a lowest point of the uneven measurement surface by a respective low point stop of a first; a high point isolator member moveable relative to the frame, the high point isolator member indicating a highest point of the uneven measurement surface by a respective high point stop of a second pin; a low point displacement sensor for identifying a low point displacement; a high point displacement sensor for identifying a high point displacement; and a calculator for calculating a difference between the low point displacement and the high point displacement.

Abstract: A deflection measurement probe includes a body portion having a cavity defined by the body portion, a first positional measurement sensor disposed in the cavity of the body portion, the first positional measurement sensor including a sensor tip extending from the body portion operative to contact a measurement surface, and a second positional measurement sensor disposed in the cavity of the body portion, the first positional measurement sensor including a sensor tip extending from the body portion operative to contact a measurement surface.

Abstract: A method and apparatus is provided for compressing the lamination stack for a dynamoelectric machine. The apparatus includes a plurality of weight distribution plates and a plurality of pressing plates. The plurality of weight distribution plates are placed on one end of the lamination stack of the dynamoelectric machine. The plurality of pressing plates are placed on the plurality of weight distribution plates. A compressive force is applied to the lamination stack via the plurality of weight distribution plates and the plurality of pressing plates.

Abstract: A method and apparatus are provided for compression of a lamination stack for a dynamoelectric machine. The apparatus includes a plurality of hanger brackets attached to a face frame, a plurality of force application tubes secured to the brackets, a plurality of force applying rams located beneath the force application tubes, a plurality of pressing plates located beneath the force applying rams, and a plurality of weight distribution plates located beneath the pressing plates. A compressive force is applied to the lamination stack by the force applying rams via the pressing plates and weight distribution plates.

Abstract: A deflection measurement probe includes a body portion having a cavity defined by the body portion, a first positional measurement sensor disposed in the cavity of the body portion, the first positional measurement sensor including a sensor tip extending from the body portion operative to contact a measurement surface, and a second positional measurement sensor disposed in the cavity of the body portion, the first positional measurement sensor including a sensor tip extending from the body portion operative to contact a measurement surface.

Abstract: A method and apparatus is provided for compressing the lamination stack for a dynamoelectric machine. The apparatus includes a plurality of weight distribution plates and a plurality of pressing plates. The plurality of weight distribution plates are placed on one end of the lamination stack of the dynamoelectric machine. The plurality of pressing plates are placed on the plurality of weight distribution plates. A compressive force is applied to the lamination stack via the plurality of weight distribution plates and the plurality of pressing plates.

Abstract: A method and apparatus are provided for compression of a lamination stack for a dynamoelectric machine. The apparatus includes a plurality of hanger brackets attached to a face frame, a plurality of force application tubes secured to the brackets, a plurality of force applying rams located beneath the force application tubes, a plurality of pressing plates located beneath the force applying rams, and a plurality of weight distribution plates located beneath the pressing plates. A compressive force is applied to the lamination stack by the force applying rams via the pressing plates and weight distribution plates.