Abstract: A digital integrated circuit comprises a number of registers each of which comprises several data bits and at least one control bit cell. In a normal operation state, all the registers act as parallel input/output registers. In a SHIFT state, the data bits and control bit cells of all the registers are linked together to from a serial shift path between a pair of external terminals allowing test data to be shifted in or out as required. In a TEST state, each register is set into one of a number of test modes, controlled by the test bit cells of that register. The test modes include a test generate mode in which the register acts as a pseudo-random number generator, and a test analyze mode in which it acts as a digital signature analyzer.