Abstract: Various embodiments of the present invention provide systems and methods for determining crystallographic characteristics of a material sample. For example, a method for determining crystallographic characteristics of a sample is disclosed that includes receiving a measured image of a sample; receiving a simulated image corresponding to the sample with the simulated image being substantially free of elastic strain; comparing the measured image with the simulated image such that at least a portion of a difference between the measured image and the simulated image corresponds to an elastic strain of the sample; and using the difference to calculate the elastic strain of the sample.