Abstract: A spectrum analyzer used for making a spectrum emission mask measurement reorganizes execution of the measurement so that all frequency bands to be measured at the same resolution bandwidth are measured in a single sweep, extending between the extreme frequency limits of those bands, thereby avoiding setup delays involved in specifying successive measurements for each band individually. Portions of each measurement which correspond to frequency bands to be measured at the respective resolution bandwidth of that measurement are extracted, resized as necessary, and assembled into a complete spectrum measurement.

Abstract: Measurements are obtained of a signal within each one of multiple ranges of a parameter. For each range a representative measurement value is derived together with the extent of the range. A respective graphical display element is defined for each range of the parameter, a first dimension of each display element (such as its height) being indicative of the representative measurement value for the respective range of the parameter, and a second dimension of the display element (such as its width) being indicative of the extent of that respective range of the parameter. A display of the measured signal throughout the multiple ranges of the parameter is generated, with the graphical display elements superimposed at positions corresponding to the respective ranges of the parameter.

Abstract: Measurements are obtained of a signal within each one of multiple ranges of a parameter. For each range a representative measurement value is derived together with the extent of the range. A respective graphical display element is defined for each range of the parameter, a first dimension of each display element (such as its height) being indicative of the representative measurement value for the respective range of the parameter, and a second dimension of the display element (such as its width) being indicative of the extent of that respective range of the parameter. A display of the measured signal throughout the multiple ranges of the parameter is generated, with the graphical display elements superimposed at positions corresponding to the respective ranges of the parameter.

Abstract: A spectrum analyser used for making a spectrum emission mask measurement reorganises execution of the measurement so that all frequency bands to be measured at the same resolution bandwidth are measured in a single sweep, extending between the extreme frequency limits of those bands, thereby avoiding setup delays involved in specifying successive measurements for each band individually. Portions of each measurement which correspond to frequency bands to be measured at the respective resolution bandwidth of that measurement are extracted, resized as necessary, and assembled into a complete spectrum measurement.