Patents by Inventor Stuart W. Wrenn

Stuart W. Wrenn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6559655
    Abstract: A system for analyzing agricultural products on harvesting equipment includes a test chamber and a near infrared spectrometer disposed within a housing capable of being mounted on the harvesting equipment. A source of near infrared radiation is disposed in the housing adjacent the test chamber so as to emit near infrared radiation into the test chamber, and a near infrared detector is disposed in the housing adjacent the test chamber so as to receive near infrared radiation exiting the test chamber. The spectrometer is mounted on vibration damping elements. A computer controls operation of first and second doors for controlling ingress and egress of product samples from the test chamber and can also be used to process signals from the spectrometer.
    Type: Grant
    Filed: April 30, 2001
    Date of Patent: May 6, 2003
    Assignee: Zeltex, Inc.
    Inventors: Todd C. Rosenthal, Stuart W. Wrenn
  • Patent number: 6369388
    Abstract: A multiple-gain, hand-held, near-infrared grain analyzer analyzes, e.g., protein content of grain by infrared transmittance and interactance (transflectance) has at least two gain values. A first gain value is used when calibrating the analyzer with an empty analysis chamber (empty except for the presence of air), and a second, higher gain value is used when analyzing grain samples.
    Type: Grant
    Filed: January 3, 2001
    Date of Patent: April 9, 2002
    Assignee: Zeltex, Inc.
    Inventors: Todd C. Rosenthal, Stuart W. Wrenn
  • Patent number: 6281501
    Abstract: A multiple-gain, hand-held, near-infrared grain analyzer analyzes, e.g., protein content of grain by infrared transmittance and interactance (transflectance) has at least two gain values. A first gain value is used when calibrating the analyzer with an empty analysis chamber (empty except for the presence of air), and a second, higher gain value is used when analyzing grain samples.
    Type: Grant
    Filed: April 17, 1998
    Date of Patent: August 28, 2001
    Assignee: Zeltex, Inc.
    Inventors: Todd C. Rosenthal, Stuart W. Wrenn
  • Publication number: 20010000910
    Type: Application
    Filed: January 3, 2001
    Publication date: May 10, 2001
    Applicant: Zeltex, Inc.
    Inventors: Todd C. Rosenthal, Stuart W. Wrenn