Abstract: There is provided an X-ray product inspection apparatus and a method of controlling the X-ray product inspection apparatus. The apparatus comprises an X-ray generator comprising an aperture for outputting an X-ray beam, and a shutter apparatus arranged across the aperture. The shutter apparatus comprises a moveable shutter plate having a barrier portion of X-ray attenuating material configured to substantially block the X-ray beam; and an actuator mechanism configured to move the shutter plate between a closed position in which the barrier portion is disposed across the aperture to substantially block the X-ray beam and an open position in which the barrier portion is offset from the aperture to enable at least partial emission of the X-ray beam.