Patents by Inventor Su Ann Lim

Su Ann Lim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Dynamically determining measurement uncertainty (MU) of measurement devices
    Patent number: 11543448
    Abstract: A method is provided for dynamically determining measurement uncertainty (MU) of a measurement device for measuring a signal output by a device under test (DUT). The method includes storing characterized test data in a nonvolatile memory in the measurement device, the characterized test data being specific to the measurement device for a plurality of sources of uncertainty; receiving a parameter value of the DUT; measuring the signal output by the DUT and received by the measurement device; and calculating the measurement uncertainty of the measurement device for measuring the received signal using the stored characterized test data and the received parameter value of the DUT.
    Type: Grant
    Filed: December 23, 2013
    Date of Patent: January 3, 2023
    Assignee: Keysight Technologies, Inc.
    Inventors: Su Ann Lim, Ghazali Bin Hussin, Hwei Liat Law, Wei Zhi Ng
  • DYNAMICALLY DETERMINING MEASUREMENT UNCERTAINTY (MU) OF MEASUREMENT DEVICES
    Publication number: 20150177315
    Abstract: A method is provided for dynamically determining measurement uncertainty (MU) of a measurement device for measuring a signal output by a device under test (DUT). The method includes storing characterized test data in a nonvolatile memory in the measurement device, the characterized test data being specific to the measurement device for a plurality of sources of uncertainty; receiving a parameter value of the DUT; measuring the signal output by the DUT and received by the measurement device; and calculating the measurement uncertainty of the measurement device for measuring the received signal using the stored characterized test data and the received parameter value of the DUT.
    Type: Application
    Filed: December 23, 2013
    Publication date: June 25, 2015
    Inventors: Su Ann Lim, Ghazali Bin Hussin, Hwei Liat Law, Wei Zhi Ng
  • Automatic placement of measurement gates
    Patent number: 8185330
    Abstract: A method and apparatus is provided for setting time positions of measurement gates on a signal under test. Signal transition data is calculated by a processor for multiple signal transitions. Measurement gate start and end positions are set relative to the multiple signal transitions based on the received signal transition data.
    Type: Grant
    Filed: March 26, 2008
    Date of Patent: May 22, 2012
    Assignee: Agilent Technologies, Inc.
    Inventors: Ling Ling Lye, Fook Shian Toong, Eric Breakenridge, Su Ann Lim
  • Automatic Placement of Measurement Gates
    Publication number: 20080306703
    Abstract: A method and apparatus is provided for setting time positions of measurement gates on a signal under test. Signal transition data is calculated by a processor for multiple signal transitions. Measurement gate start and end positions are set relative to the multiple signal transitions based on the received signal transition data.
    Type: Application
    Filed: March 26, 2008
    Publication date: December 11, 2008
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventors: LING LING LYE, FOOK SHIAN TOONG, ERIC BREAKENRIDGE, SU ANN LIM