Patents by Inventor Su-Fen Cheng

Su-Fen Cheng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • STORAGE DEVICE
    Publication number: 20120171959
    Abstract: A storage device includes an access control module and a Bluetooth transmission module. The storage device can control a data access right through a mobile device performing authentication. After receiving a start signal, the Bluetooth transmission module searches for a mobile device, and permits access to the access control module according to a Bluetooth position and pairing data.
    Type: Application
    Filed: March 14, 2011
    Publication date: July 5, 2012
    Applicant: DEUTRON ELECTRONICS CORP.
    Inventor: Su-Fen Cheng
  • Method of building a defect database
    Patent number: 7020536
    Abstract: First, a wafer with a plurality of defects generated in a first semiconductor process is provided. A defect inspection is performed to detect the defects on the wafer. Then, an automatic defect classification is performed according to a predetermined defect database having a defect classification recipe generated from a second semiconductor process. After that, a verifying process is further performed by comparing the result of the automatic defect classification with that of a manual defect classification to verify the accuracy of the automatic defect classification.
    Type: Grant
    Filed: February 6, 2004
    Date of Patent: March 28, 2006
    Assignee: Powerchip Semiconductor Corp.
    Inventors: Long-Hui Lin, Feng-Ming Kuo, Su-Fen Cheng
  • METHOD OF BUILDING A DEFECT DATABASE
    Publication number: 20050177264
    Abstract: First, a wafer with a plurality of defects generated in a first semiconductor process is provided. A defect inspection is performed to detect the defects on the wafer. Then, an automatic defect classification is performed according to a predetermined defect database having a defect classification recipe generated from a second semiconductor process. After that, a verifying process is further performed by comparing the result of the automatic defect classification with that of a manual defect classification to verify the accuracy of the automatic defect classification.
    Type: Application
    Filed: February 6, 2004
    Publication date: August 11, 2005
    Inventors: Long-Hui Lin, Feng-Ming Kuo, Su-Fen Cheng