Patents by Inventor Suan Jeung Boon
Suan Jeung Boon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 7112471Abstract: A leadless image sensor package and methods for its assembly. In a first embodiment, an image sensor chip is mounted within a bottom-side cavity of a package shell in a flip-chip manner such that sensing circuitry on the image sensor chip is exposed through an aperture in the top side of the package shell. A transparent encapsulant material is deposited within the aperture to encase interconnect bonds between the package shell and the image sensor chip. A transparent lid is held in place over the aperture by the encapsulant material. The back surface of the image sensor chip is left exposed. In a second embodiment particularly suitable for high-end image sensors, an encapsulant material is not required. Instead, a backing cap is hermetically sealed to a ledge surface in the package shell to cover the bottom-side cavity. A compression member formed on the backing cap contacts the image sensor chip and maintains interconnect bond integrity.Type: GrantFiled: October 23, 2003Date of Patent: September 26, 2006Assignee: Micron Technology, Inc.Inventors: Suan Jeung Boon, Yong Poo Chia, Yong Loo Neo, Swee Kwang Chua, Siu Waf Low
-
Patent number: 7087992Abstract: The present invention defines a packaging implementation providing a multichip multilayer system on a chip solution. Greater integration of a plurality and variety of known good die contained within cavities formed in a separate substrate is achieved. Additional redistribution and interconnect layers above the multichip configuration may be formed with the redistribution layers terminating in electrical connections such as conductive bumps or balls. In one embodiment, the substrate cavities receive signal device connections, such as conductive bumps, of a plurality of semiconductor dice in a flip-chip configuration. A portion of the substrate's back surface is then removed to a depth sufficient to expose the conductive bumps. In another embodiment, the cavities receive the semiconductor dice with their active surface facing up, wherein metal layer connections are formed and coupled to bond pads or other electrical connectors of the semiconductor dice.Type: GrantFiled: November 30, 2004Date of Patent: August 8, 2006Assignee: Micron Technology, Inc.Inventors: Swee Kwang Chua, Siu Waf Low, Yong Poo Chia, Meow Koon Eng, Yong Loo Neo, Suan Jeung Boon, Suangwu Huang, Wei Zhou
-
Patent number: 6987031Abstract: A semiconductor device package and method of fabricating the same. The semiconductor device package may include a variety of semiconductor dice, thereby providing a system on a chip solution. The semiconductor dice are attached to connection locations associated with a conductive trace layer such as through flip-chip technology. A plurality of circuit connection elements is also coupled to the conductive trace layer, either directly or through additional, intervening conductive trace layers. An encapsulation layer may be formed over the dice and substrate. Portions of the circuit connection elements remain exposed through the encapsulation layer for connection to external devices. A plurality of conductive bumps may be formed, each conductive bump being disposed atop an exposed portion of a circuit connection element, to facilitate electrical connection with an external device.Type: GrantFiled: August 27, 2002Date of Patent: January 17, 2006Assignee: Micron Technology, Inc.Inventors: Meow Koon Eng, Yong Poo Chia, Yong Loo Neo, Suan Jeung Boon, Siu Waf Low, Swee Kwang Chua, Suangwu Huang
-
Patent number: 6964881Abstract: The present invention defines a packaging implementation providing a multichip multilayer system on a chip solution. Greater integration of a plurality and variety of known good die are contained within cavities formed in a separate substrate is achieved. Additional redistribution and interconnect layers above the multichip configuration may be formed with the redistribution layers terminating in electrical connections such as conductive bumps or balls. In one embodiment, the cavities of the substrate receive signal device connections, such as conductive bumps, of a plurality of semiconductor dice in a flip-chip configuration. A portion of the back surface of the substrate is then removed to a depth sufficient to expose the conductive bumps. In another embodiment, the cavities receive the semiconductor dice with the active surface of the semiconductor dice facing up, wherein metal layer connections are formed and coupled bond pads or other electrical connectors of the semiconductor dice.Type: GrantFiled: August 27, 2002Date of Patent: November 15, 2005Assignee: Micron Technology, Inc.Inventors: Swee Kwang Chua, Siu Waf Low, Yong Poo Chia, Meow Koon Eng, Yong Loo Neo, Suan Jeung Boon, Suangwu Huang, Wei Zhou
-
Patent number: 6958537Abstract: A semiconductor device package is disclosed. The semiconductor device package may include a variety of semiconductor dice, thereby providing a system on a chip solution. The semiconductor dice are attached to connection locations associated with a conductive trace layer such as through flip-chip technology. A plurality of circuit connection elements is also coupled to the conductive trace layer, either directly or through additional, intervening conductive trace layers. An encapsulation layer may be formed over the dice and substrate. Portions of the circuit connection elements remain exposed through the encapsulation layer for connection to external devices. A plurality of conductive bumps may be formed, each conductive bump being disposed atop an exposed portion of a circuit connection element, to facilitate electrical connection with an external device.Type: GrantFiled: August 4, 2004Date of Patent: October 25, 2005Assignee: Micron Technology, Inc.Inventors: Meow Koon Eng, Yong Poo Chia, Yong Loo Neo, Suan Jeung Boon, Siu Waf Low, Swee Kwang Chua, Suangwu Huang
-
Publication number: 20050116337Abstract: The present invention defines a packaging implementation providing a multichip multilayer system on a chip solution. Greater integration of a plurality and variety of known good die contained within cavities formed in a separate substrate is achieved. Additional redistribution and interconnect layers above the multichip configuration may be formed with the redistribution layers terminating in electrical connections such as conductive bumps or balls. In one embodiment, the substrate cavities receive signal device connections, such as conductive bumps, of a plurality of semiconductor dice in a flip-chip configuration. A portion of the substrate's back surface is then removed to a depth sufficient to expose the conductive bumps. In another embodiment, the cavities receive the semiconductor dice with their active surface facing up wherein metal layer connections are formed and coupled to bond pads or other electrical connectors of the semiconductor dice.Type: ApplicationFiled: January 3, 2005Publication date: June 2, 2005Inventors: Swee Kwang Chua, Siu Waf Low, Yong Poo Chia, Meow Koon Eng, Yong Loo Neo, Suan Jeung Boon, Shuangwu Huang, Wei Zhou
-
Patent number: 6882021Abstract: Packaged microelectronic devices and methods of packaging microelectronic devices are disclosed herein. In one embodiment, the device includes an image sensor die having a first side with a bond-pad, an active area on the first side, and a second side opposite the first side. The device further includes a window at the first side of the image sensor die and a lead mounted to the second side of the image sensor die. The window is radiation transmissive and positioned over the active area of the image sensor die. The lead is electrically coupled to the bond-pad on the image sensor die.Type: GrantFiled: August 29, 2003Date of Patent: April 19, 2005Assignee: Micron Technology, Inc.Inventors: Suan Jeung Boon, Yong Poo Chia, Min Yu Chan, Meow Koon Eng, Siu Waf Low, Swee Kwang Chua
-
Patent number: 6856155Abstract: A testing scheme for ball-grid array devices of different sizes where the same ball-grid pattern may be tested using the same set of test adapters. A testing scheme includes providing a plurality of devices having a predetermined pattern of solder balls attached, providing a plurality of adapters secured to a test board, each of the adapters including a plurality of test contacts arranged in a pattern corresponding to the predetermined pattern of solder balls, removably attaching the plurality of devices to a device holding apparatus such that the predetermined pattern of solder balls on the devices corresponds to the predetermined pattern of test contacts on the plurality of adapters, then positioning the device holding apparatus to bring the plurality of solder balls in contact with the plurality of test contacts.Type: GrantFiled: October 7, 2002Date of Patent: February 15, 2005Assignee: Micron Technology, Inc.Inventors: Wuu Yean Tay, Yong Kian Tan, Yong Poo Chia, Siu Waf Low, Suan Jeung Boon, Soon Huat Goh
-
Publication number: 20040238909Abstract: Packaged microelectronic devices and methods of packaging microelectronic devices are disclosed herein. In one embodiment, the device includes an image sensor die having a first side with a bond-pad, an active area on the first side, and a second side opposite the first side. The device further includes a window at the first side of the image sensor die and a lead mounted to the second side of the image sensor die. The window is radiation transmissive and positioned over the active area of the image sensor die. The lead is electrically coupled to the bond-pad on the image sensor die.Type: ApplicationFiled: August 29, 2003Publication date: December 2, 2004Inventors: Suan Jeung Boon, Yong Poo Chia, Min Yu Chan, Meow Koon Eng, Siu Waf Low, Swee Kwang Chua
-
Patent number: 6825553Abstract: The present invention defines a packaging implementation providing a multichip multilayer system on a chip solution. Greater integration of a plurality and variety of known good die contained within cavities formed in a separate substrate is achieved. Additional redistribution and interconnect layers above the multichip configuration may be formed with the redistribution layers terminating in electrical connections such as conductive bumps or balls. In one embodiment, the substrate cavities receive signal device connections, such as conductive bumps, of a plurality of semiconductor dice in a flip-chip configuration. A portion of the substrate's back surface is then removed to a depth sufficient to expose the conductive bumps. In another embodiment, the cavities receive the semiconductor dice with their active surface facing up wherein metal layer connections are formed and coupled to bond pads or other electrical connectors of the semiconductor dice.Type: GrantFiled: September 5, 2003Date of Patent: November 30, 2004Assignee: Micron Technology, Inc.Inventors: Swee Kwang Chua, Siu Waf Low, Yong Poo Chia, Meow Koon Eng, Yong Loo Neo, Suan Jeung Boon, Suangwu Huang, Wei Zhou
-
Publication number: 20040229400Abstract: The present invention defines a packaging implementation providing a multichip multilayer system on a chip solution. Greater integration of a plurality and variety of known good die contained within cavities formed in a separate substrate is achieved. Additional redistribution and interconnect layers above the multichip configuration may be formed with the redistribution layers terminating in electrical connections such as conductive bumps or balls. In one embodiment, the cavities of the substrate receive signal device connections, such as conductive bumps, of a plurality of semiconductor dice in a flip-chip configuration. A portion of the back surface of the substrate is then removed to a depth sufficient to expose the conductive bumps. In another embodiment, the cavities receive the semiconductor dice with the active surface of the semiconductor dice facing up wherein metal layer connections are formed and coupled to bond pads or other electrical connectors of the semiconductor dice.Type: ApplicationFiled: June 22, 2004Publication date: November 18, 2004Inventors: Swee Kwang Chua, Siu Waf Low, Yong Poo Chia, Meow Koon Eng, Yong Loo Neo, Suan Jeung Boon, Shuangwu Huang, Wei Zhou
-
Publication number: 20040221451Abstract: A method for packaging integrated circuit chips (die) is described that includes providing a base substrate with package level contacts, coating a base substrate with adhesive, placing dies on the adhesive, electrically connecting the die to the package level contacts, and removing the backside of the base substrate to expose the backside of the package level contacts. Accordingly, an essentially true chip scale package is formed. Multi-chip modules are formed by filling gaps between the chips with an encapsulant. In an embodiment, chips are interconnected by electrical connections between package level contacts in the base substrate. In an embodiment, substrates each having chips are adhered back-to-back with through vias formed in aligned saw streets to interconnect the back-to-back chip assembly.Type: ApplicationFiled: December 23, 2003Publication date: November 11, 2004Applicant: Micron Technology, Inc.Inventors: Yong Poo Chia, Low Siu Waf, Suan Jeung Boon, Eng Meow Koon, Swee Kwang Chua
-
Publication number: 20040113246Abstract: Methods for producing a flip chip package by prepackaging one or more dice on a semiconductor wafer are provided. An embodiment of the method includes applying an adhesive to a first side of a finished wafer, where a number of dice are located. The active layer of the dice is on the first side of the finished wafer. The method further includes forming an array of conductive elements within the adhesive, where the array of conductive elements is electrically coupled to an array of connection pads on a die. The wafer can be diced to provide pre-packaged chips. To provide greater mounting densities, two or more dice may be coupled before application of the adhesive layer.Type: ApplicationFiled: November 26, 2003Publication date: June 17, 2004Applicant: Micron Technology, Inc.Inventor: Suan Jeung Boon
-
Publication number: 20040104486Abstract: Flip chip packages formed at a wafer level on semiconductor wafers for electronic systems provide convenient prepackaging. The package, in one embodiment, includes an adhesive layer applied to an active side of the wafer. The adhesive layer has openings to permit access to the conductive pads on each die. A conductive material substantially fills the openings. A pre-packaged die diced from the semiconductor wafer is mounted to a support wherein the conductive material effects electrical interconnection between the conductive pads on the die and receiving conductors on the support. The pre-packaged die can be coupled to a processor for an electronic system. To provide greater mounting densities, two or more dice may be coupled with the adhesive layer providing a covering for the two or more dice. The prepackaged chip with two or more dice may be coupled to a processor reducing the volume needed in an electronic system.Type: ApplicationFiled: November 26, 2003Publication date: June 3, 2004Applicant: Micron Technology, Inc.Inventor: Suan Jeung Boon
-
Publication number: 20040084741Abstract: A leadless image sensor package and methods for its assembly. In a first embodiment, an image sensor chip is mounted within a bottom-side cavity of a package shell in a flip-chip manner such that sensing circuitry on the image sensor chip is exposed through an aperture in the top side of the package shell. A transparent encapsulant material is deposited within the aperture to encase interconnect bonds between the package shell and the image sensor chip. A transparent lid is held in place over the aperture by the encapsulant material. The back surface of the image sensor chip is left exposed. In a second embodiment particularly suitable for high-end image sensors, an encapsulant material is not required. Instead, a backing cap is hermetically sealed to a ledge surface in the package shell to cover the bottom-side cavity. A compression member formed on the backing cap contacts the image sensor chip and maintains interconnect bond integrity.Type: ApplicationFiled: October 23, 2003Publication date: May 6, 2004Inventors: Suan Jeung Boon, Yong Poo Chia, Yong Loo Neo, Swee Kwang Chua, Siu Waf Low
-
Patent number: 6710454Abstract: Flip chip packages and methods for producing a flip chip package by prepackaging one or more dice on a semiconductor wafer. The package, in one embodiment, includes an adhesive layer applied to an active side of the wafer. The adhesive layer has openings to permit access to the conductive pads on each die. A conductive material substantially fills the openings. Once diced from the wafer, the pre-packaged die is then surface mounted to a support wherein the conductive material effects electrical interconnection between the conductive pads on the die and receiving conductors on the support. In one embodiment, the package is heated to reflow the conductive material and bond the adhesive layer to the support. In another embodiment, the adhesive layer and conductive material are joined to the support by application of pressure. A protective layer is optionally formed on the back side of the wafer before dicing to complete the wafer package.Type: GrantFiled: February 16, 2000Date of Patent: March 23, 2004Assignee: Micron Technology, Inc.Inventor: Suan Jeung Boon
-
Publication number: 20040046250Abstract: The present invention defines a packaging implementation providing a multichip multilayer system on a chip solution. Greater integration of a plurality and variety of known good die contained within cavities formed in a separate substrate is achieved. Additional redistribution and interconnect layers above the multichip configuration may be formed with the redistribution layers terminating in electrical connections such as conductive bumps or balls. In one embodiment, the substrate cavities receive signal device connections, such as conductive bumps, of a plurality of semiconductor dice in a flip-chip configuration. A portion of the substrate's back surface is then removed to a depth sufficient to expose the conductive bumps. In another embodiment, the cavities receive the semiconductor dice with their active surface facing up wherein metal layer connections are formed and coupled to bond pads or other electrical connectors of the semiconductor dice.Type: ApplicationFiled: September 5, 2003Publication date: March 11, 2004Inventors: Swee Kwang Chua, Siu Waf Low, Yong Poo Chia, Meow Koon Eng, Yong Loo Neo, Suan Jeung Boon, Shuangwu Huang, Wei Zhou
-
Publication number: 20040042190Abstract: A semiconductor device package and method of fabricating the same. The semiconductor device package includes The package may include a variety of semiconductor dice thereby providing a system on a chip solution. The semiconductor dice are attached to connection locations associated with a conductive trace layer such as through flip-chip technology. A plurality of circuit connection elements are also coupled to the conductive trace layer, either directly or through additional, intervening conductive trace layers. An encapsulation layer may be formed over the dice and substrate. Portions of the circuit connection elements remain exposed through the encapsulation layer for connection to external devices. A plurality of conductive bumps may be formed, each conductive bump being disposed atop an exposed portion of a circuit connection element, to facilitate electrical connection with an external device.Type: ApplicationFiled: August 27, 2002Publication date: March 4, 2004Inventors: Meow Koon Eng, Yong Poo Chia, Yong Loo Neo, Suan Jeung Boon, Siu Waf Low, Swee Kwang Chua, Shuangwu Huang
-
Publication number: 20040043533Abstract: The present invention defines a packaging implementation providing a multi-chip multi-layer system on a chip solution. Greater integration of a plurality and variety of known good die are contained within cavities formed in a separate substrate. Additional redistribution and interconnect layers above the multi-chip configuration may be formed with the redistribution layers terminating in electrical connections such as conductive bumps or balls. In one embodiment the cavities of the substrate receive signal device connections, such as conductive bumps, of a plurality of dice in a flip-chip configuration. A portion of the back surface of the substrate is then removed to a depth sufficient to expose the conductive bumps. In another embodiment the cavities receive the dice with the active surface of the dice facing up wherein metal layer connections are formed and coupled bond pads or other electrical connectors of the dice.Type: ApplicationFiled: August 27, 2002Publication date: March 4, 2004Inventors: Swee Kwang Chua, Siu Waf Low, Yong Poo Chia, Meow Koon Eng, Yong Loo Neo, Suan Jeung Boon, Shuangwu Huang, Wei Zhou
-
Publication number: 20040041221Abstract: A leadless image sensor package and methods for its assembly. In a first embodiment, an image sensor chip is mounted within a bottom side cavity of a package shell in a flip-chip manner such that sensing circuitry on the image sensor chip is exposed through an aperture in the top side of the package shell. A transparent encapsulant material is deposited within the aperture to encase interconnect bonds between the package shell and the image sensor chip. A transparent lid is held in place over the aperture by the encapsulant material. The back surface of the image sensor chip is left exposed. In a second embodiment particularly suitable for high-end image sensors, an encapsulant material is not required. Instead, a backing cap is hermetically sealed to a ledge surface in the package shell to cover the bottom side cavity. A compression member formed on the backing cap contacts the image sensor chip and maintains interconnect bond integrity.Type: ApplicationFiled: August 28, 2002Publication date: March 4, 2004Inventors: Suan Jeung Boon, Yong Poo Chia, Yong Loo Neo, Swee Kwang Chua, Siu Waf Low