Patents by Inventor Subhalakshmi M. Falknor
Subhalakshmi M. Falknor has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250228174Abstract: A cultivation system (100) includes a substantially vertical film (10) including a distribution of holes (12) each to receive a basket (50). A mounting mechanism (20) is disposed adjacent to a top edge of the vertical film. The system allows for a customized distribution of the holes and thus allows for the control of the spacing between the received baskets. The vertical film further includes water-guiding features (e.g., channels) to flow fluid primarily by gravity and direct the fluid to the holes.Type: ApplicationFiled: July 5, 2022Publication date: July 17, 2025Inventors: Jonathan B. Arthur, Milo G. Oien-Rochat, David L. Morrissey, Subhalakshmi M. Falknor, David H. Redinger
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Publication number: 20250001221Abstract: A fit detection system for a respiratory protection device is presented. The system includes a camera that captures an image sequence of a user wearing the respiratory protection device. The system also includes a feature extractor that analyzes the image sequence and extracts features from the image sequence. The system also includes a fit score calculator that analyzes the extracted features and calculates a fit score indicative of how well the respiratory protection device fits the user. The system also includes a communication component that communicates the fit score.Type: ApplicationFiled: July 5, 2022Publication date: January 2, 2025Inventors: Muhammad J. Afridi, Subhalakshmi M. Falknor, Wei Zhao, Ambuj Sharma, Vahid Mirjalili, Caroline M. Ylitalo, Philip D. Eitzman, Marie D. Manner
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Patent number: 12026862Abstract: At least some embodiments of the present disclosure directs to a method for processing an input image having an embedded element, comprising the steps of: computing one or more histograms of the input image; identifying a range of interest in one of the one or more histograms; and determining, by the processor, a threshold based on the range of interest. In some embodiments, a computing device processes the input image using the threshold to generate an output image.Type: GrantFiled: October 8, 2020Date of Patent: July 2, 2024Assignee: 3M Innovative Properties CompanyInventors: Christopher R. Yungers, Nathan A. Christopherson, Jonathan D. Gandrud, Justin M. Johnson, Subhalakshmi M. Falknor
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Publication number: 20220343092Abstract: At least some embodiments of the present disclosure directs to a method for processing an input image having an embedded element, comprising the steps of: computing one or more histograms of the input image; identifying a range of interest in one of the one or more histograms; and determining, by the processor, a threshold based on the range of interest. In some embodiments, a computing device processes the input image using the threshold to generate an output image.Type: ApplicationFiled: October 8, 2020Publication date: October 27, 2022Inventors: Christopher R. Yungers, Nathan A. Christopherson, Jonathan D. Gandrud, Justin M. Johnson, Subhalakshmi M. Falknor
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Patent number: 11371952Abstract: An armor piece may include a tested material. The armor piece also may include a plurality of electrical contacts distributed about and electrically connected to the tested material. The armor piece further may include a non-volatile memory (NVM) device. The NVM device may be hardened against exposure to x-ray radiation. The NVM device may be configured to store control voltages associated with respective electrical contacts of the plurality of electrical contacts.Type: GrantFiled: October 16, 2020Date of Patent: June 28, 2022Assignee: 3M INNOVATIVE PROPERTIES COMPANYInventors: Christopher R. Yungers, Subhalakshmi M. Falknor, David H. Redinger
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Patent number: 11255807Abstract: A measurement system may include control electronics; an electrical signal source; a plurality of measurement system electrical contacts; at least one feature for repeatably electrically connecting the plurality of measurement system electrical contacts to selected locations of a tested material. The control electronics may be configured to cause the electrical signal source to output an electrical signal; determine a measured voltage in response to the electrical signal using a measurement electrical contact from the plurality of measurement system electrical contacts. The measurement electrical contact is electrically coupled to the tested material. The control electronics also may be configured to determine whether the tested material includes a crack or other defect based on the measured voltage.Type: GrantFiled: November 15, 2017Date of Patent: February 22, 2022Assignee: 3M INNOVATIVE PROPERTIES COMPANYInventors: Eric M. Chinnock, Christopher R. Yungers, Subhalakshmi M. Falknor, David H. Redinger
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Patent number: 11112374Abstract: A method may include coupling a first electrical connector of an article to a second electrical connector of a measurement device. The article may include a tested material, the first electrical connector, and a plurality of electrical contacts electrically connected to the first electrical connector. The measurement device may include a power source and a user interface. The method also may include causing, by a controller, an electrical signal to be applied to a pair of drive electrical contacts from the plurality of electrical contacts. The method further may include receiving, by the controller, from an analog-to-digital converter, a measured voltage measured using a measurement electrical contact from the plurality of electrical contacts. The method also may include determining, by the controller, whether the tested material includes a crack or other defect based on the measured voltage.Type: GrantFiled: December 15, 2017Date of Patent: September 7, 2021Assignee: 3M INNOVATIVE PROPERTIES COMPANYInventors: Christopher R. Yungers, Subhalakshmi M. Falknor, David H. Redinger, Ronald D. Jesme, Eric M. Chinnock
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Patent number: 11105762Abstract: A measurement system may include a set of drive electrical contacts including a force electrical contact and a return electrical contact electrically coupled to a tested material, a measurement electrical contact electrically coupled to the tested material, a return node, a voltage source, and a control module. A circuit path between the voltage source and the return node may include a fixed resistor and the tested material. The control module may be configured to cause the voltage source to apply a voltage signal to the force electrical contact, cause a voltage drop across the fixed resistor to be measured, cause a measured voltage to be measured using the measurement electrical contact, determine a measured equivalent impedance of the tested material associated with the measurement electrical contact based on the voltage drop across the fixed resistor and the measured voltage, and determine whether the tested material includes a crack or other defect based on the measured equivalent impedance.Type: GrantFiled: December 15, 2017Date of Patent: August 31, 2021Assignee: 3M INNOVATIVE PROPERTIES COMPANYInventors: Christopher R. Yungers, Subhalakshmi M. Falknor, David H. Redinger
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Publication number: 20210048403Abstract: An armor piece may include a tested material. The armor piece also may include a plurality of electrical contacts distributed about and electrically connected to the tested material. The armor piece further may include a non-volatile memory (NVM) device. The NVM device may be hardened against exposure to x-ray radiation. The NVM device may be configured to store control voltages associated with respective electrical contacts of the plurality of electrical contacts.Type: ApplicationFiled: October 16, 2020Publication date: February 18, 2021Inventors: Christopher R. Yungers, Subhalakshmi M. Falknor, David H. Redinger
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Publication number: 20210020039Abstract: In some examples, a computing device may store a temporary traffic control zone compliance set (TTCZCS) comprising a set of indications of traffic control features for a temporary traffic control zone, wherein the set of indications of traffic control features represent that the temporary traffic control zone is compliant with at least one criterion; receive a set of indications of infrastructure articles from a set of sensors that detect the infrastructure articles in the traffic control zone; detect non-compliance of the at least one criterion based on an indication at least one infrastructure article in the temporary traffic control zone and at least one indication of a traffic control feature that corresponds to the infrastructure article; and perform at least one operation based on detection of the non-compliance of the at least one criterion for the temporary traffic control zone.Type: ApplicationFiled: March 28, 2019Publication date: January 21, 2021Inventors: Justin M. Johnson, James W. Howard, Subhalakshmi M. Falknor
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Patent number: 10816495Abstract: An armor piece may include a tested material. The armor piece also may include a plurality of electrical contacts distributed about and electrically connected to the tested material. The armor piece further may include a non-volatile memory (NVM) device. The NVM device may be hardened against exposure to x-ray radiation. The NVM device may be configured to store control voltages associated with respective electrical contacts of the plurality of electrical contacts.Type: GrantFiled: December 15, 2017Date of Patent: October 27, 2020Assignee: 3M INNOVATIVE PROPERTIES COMPANYInventors: Christopher R. Yungers, Subhalakshmi M. Falknor, David H. Redinger
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Publication number: 20200011826Abstract: An armor piece may include a tested material. The armor piece also may include a plurality of electrical contacts distributed about and electrically connected to the tested material. The armor piece further may include a non-volatile memory (NVM) device. The NVM device may be hardened against exposure to x-ray radiation. The NVM device may be configured to store control voltages associated with respective electrical contacts of the plurality of electrical contacts.Type: ApplicationFiled: December 15, 2017Publication date: January 9, 2020Inventors: Christopher R. Yungers, Subhalakshmi M. Falknor, David H. Redinger
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Publication number: 20190383763Abstract: A measurement system may include a set of drive electrical contacts including a force electrical contact and a return electrical contact electrically coupled to a tested material, a measurement electrical contact electrically coupled to the tested material, a return node, a voltage source, and a control module. A circuit path between the voltage source and the return node may include a fixed resistor and the tested material. The control module may be configured to cause the voltage source to apply a voltage signal to the force electrical contact, cause a voltage drop across the fixed resistor to be measured, cause a measured voltage to be measured using the measurement electrical contact, determine a measured equivalent impedance of the tested material associated with the measurement electrical contact based on the voltage drop across the fixed resistor and the measured voltage, and determine whether the tested material includes a crack or other defect based on the measured equivalent impedance.Type: ApplicationFiled: December 15, 2017Publication date: December 19, 2019Inventors: Christopher R. Yungers, Subhalakshmi M. Falknor, David H. Redinger
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Publication number: 20190346393Abstract: A measurement system may include control electronics; an electrical signal source; a plurality of measurement system electrical contacts; at least one feature for repeatably electrically connecting the plurality of measurement system electrical contacts to selected locations of a tested material. The control electronics may be configured to cause the electrical signal source to output an electrical signal; determine a measured voltage in response to the electrical signal using a measurement electrical contact from the plurality of measurement system electrical contacts. The measurement electrical contact is electrically coupled to the tested material. The control electronics also may be configured to determine whether the tested material includes a crack or other defect based on the measured voltage.Type: ApplicationFiled: November 15, 2017Publication date: November 14, 2019Inventors: Eric M. Chinnock, Christopher R. Yungers, Subhalakshmi M. Falknor, David H. Redinger
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Publication number: 20190323980Abstract: A method may include coupling a first electrical connector of an article to a second electrical connector of a measurement device. The article may include a tested material, the first electrical connector, and a plurality of electrical contacts electrically connected to the first electrical connector. The measurement device may include a power source and a user interface. The method also may include causing, by a controller, an electrical signal to be applied to a pair of drive electrical contacts from the plurality of electrical contacts. The method further may include receiving, by the controller, from an analog-to-digital converter, a measured voltage measured using a measurement electrical contact from the plurality of electrical contacts. The method also may include determining, by the controller, whether the tested material includes a crack or other defect based on the measured voltage.Type: ApplicationFiled: December 15, 2017Publication date: October 24, 2019Inventors: Christopher R. Yungers, Subhalakshmi M. Falknor, David H. Redinger, Ronald D. Jesme, Eric M. Chinnock