Abstract: An electronic device, such as a memory device, may include various circuit components. The electronic device may also include one or more voltage testing circuits to determine whether signals of one or more of the circuit components are within acceptable voltage ranges of the respective circuit components. Systems and methods are described to improve correct voltage measurement of the received signals by a voltage testing circuit. In particular, multiple supply voltage levels are provided to different components of the voltage testing circuit to provide a sufficient headroom voltage gap between received signals and the supply voltages. For example, some active circuits (e.g., operational amplifiers) of the voltage testing circuit may receive a higher supply voltage of the electronic device compared to one or more other circuits of the voltage testing circuit.

Abstract: A system and method for monitoring analog front-end (AFE) circuitry of an inductive position sensor. A redundant AFE channel is provided and alternatively utilized with a sine AFE channel or a cosine AFE channel of the AFE circuitry to obtain a voltage difference that may result in a detection angle error at the electronic control unit (ECU) of the inductive position sensor.

Abstract: A system and method for monitoring analog front-end (AFE) circuitry of an inductive position sensor. A redundant AFE channel is provided and alternatively utilized with a sine AFE channel or a cosine AFE channel of the AFE circuitry to obtain a voltage difference that may result in a detection angle error at the electronic control unit (ECU) of the inductive position sensor.

Abstract: Various electronics systems may benefit from appropriate limitation of short-to-ground current. For example, sensor systems may benefit from a voltage sensing mechanism to minimize short-to-ground current for low drop-out and bypass mode regulators. A system can include a first power transistor configured to operate in a low drop-out mode. The system can also include a short to ground sensor configured to control current to the first power transistor. The short to ground sensor can be configured to limit a maximum short-circuit current below a predefined load current capability.

Abstract: Various electronics systems may benefit from appropriate limitation of short-to-ground current. For example, sensor systems may benefit from a voltage sensing mechanism to minimize short-to-ground current for low drop-out and bypass mode regulators. A system can include a first power transistor configured to operate in a low drop-out mode. The system can also include a short to ground sensor configured to control current to the first power transistor. The short to ground sensor can be configured to limit a maximum short-circuit current below a predefined load current capability.