Patents by Inventor Subhra MUKHERJEE

Subhra MUKHERJEE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230141408
    Abstract: A device may receive historical project data identifying experiences and/or work product from previous projects and client data identifying a client with a problem, and may process the historical project data and the client data, with machine learning models, to generate recommendations for the problem and confidence scores for the recommendations. The device may process the recommendations and the confidence scores, with an NLG model, to generate a solution to the problem and content for the solution, and may generate a digitized dynamic client solution to the problem based on the solution and the content. The device may provide the digitized dynamic client solution to a user device, and may receive feedback on the digitized dynamic client solution from the user device. The device may generate a final digitized dynamic client solution based on the feedback, and may perform actions based on the final digitized dynamic client solution.
    Type: Application
    Filed: November 8, 2021
    Publication date: May 11, 2023
    Inventors: Deepa YENDIGERI, Abhijeet Purushottam PATANKAR, Rajesh KUMAR SINGH, Trupti Jay KAPADIA, Anu GUPTA, Abhimanyu SIROTHIA, Manoj KUMAR, Swathi K GUPTA, Manisha MALLICK, Subhra MUKHERJEE, Chaya KOLHAR
  • Publication number: 20210056365
    Abstract: Presented herein are systems and methods for increasing reliability of object detection, comprising, receiving a plurality of images of one or more objects captured by imaging sensor(s), receiving an object classification coupled with a first probability score from machine learning model(s) trained to detect the object(s) and applied to the image(s), computing a second probability score for classification of the object(s) according to physical attribute(s) of the object(s) estimated by analyzing the image(s), computing a third probability score for classification of the object(s) according to a movement pattern of the object(s) estimated by analyzing at least some consecutive images, computing an aggregated probability score aggregating the first, second and third probability scores, and outputting, in case the aggregated probability score exceeds a certain threshold, the classification of each object coupled with the aggregated probability score for use by object detection based system(s).
    Type: Application
    Filed: July 20, 2020
    Publication date: February 25, 2021
    Applicant: Anyvision Interactive Technologies Ltd.
    Inventors: Ishay SIVAN, Ailon ETSHTEIN, Alexander ZILBERMAN, Neil Martin ROBERTSON, Sankha Subhra MUKHERJEE, Rolf Hugh BAXTER
  • Publication number: 20210034929
    Abstract: Provided herein are systems and methods for applying adaptive classes thresholds to enhance object detection Machine Learning (ML) models by receiving a plurality of labeled feature vectors extracted from a plurality of images associated with a plurality of objects, one or more subsets of the plurality of feature vectors are associated with respective object(s) and labeled accordingly, computing an adaptive threshold for each object in a plurality of iterations, each iteration comprising: (1) computing deviation of a respective feature vector of the subset from an aggregated feature vector, (2) computing, in case the deviation is within a predefined value, a threshold enclosing the respective feature vector, and (3) adjusting the adaptive threshold to enclose the threshold of the respective feature vector and outputting the adaptive threshold(s) for classifying unlabeled feature vectors to class(s) of respective object(s) associated with the adaptive threshold(s) in which the unlabeled feature vectors fall.
    Type: Application
    Filed: July 20, 2020
    Publication date: February 4, 2021
    Applicant: Anyvision Interactive Technologies Ltd.
    Inventors: Alexander ZILBERMAN, Ailon ETSHTEIN, Neil Martin ROBERTSON, Sankha Subhra MUKHERJEE, Rolf Hugh BAXTER, Ishay SIVAN, Yaaqov VALERO
  • Publication number: 20210034843
    Abstract: Presented herein are systems, methods and apparatuses for increasing reliability of face recognition in analysis of images captured by drone mounted imaging sensors, comprising: recognizing a target person in one or more iterations, each iteration comprising: identifying one or more positioning properties of the target person based on analysis of image(s) captured by imaging sensor(s) mounted on a drone operated to approach the target person, instructing the drone to adjust its position to an optimal facial image capturing position selected based on the positioning property(s), receiving facial image(s) of the target person captured by the imaging sensor(s), receiving a face classification associated with a probability score from machine learning model(s) trained to recognize the target person, and initiating another iteration in case the probability score does not exceed a certain threshold. Finally, the face classification may be outputted for use by one or more face recognition based systems.
    Type: Application
    Filed: July 20, 2020
    Publication date: February 4, 2021
    Applicant: Anyvision Interactive Technologies Ltd.
    Inventors: Ishay SIVAN, Ailon ETSHTEIN, Alexander ZILBERMAN, Neil Martin ROBERTSON, Sankha Subhra MUKHERJEE, Rolf Hugh BAXTER, Ohad SHAUBI, Idan BARAK
  • Publication number: 20140097841
    Abstract: Systems and methods for spinwave-based metrology in accordance with embodiments of the disclosure involve generating and detecting spinwaves in a sample having a ferromagnetic material; and determining a material thickness, a material integrity measure, a presence of a manufacturing defect, a categorical type of manufacturing defect, and/or a manufacturing process statistic corresponding to spinwave behavior in the sample. In an embodiment, spinwaves are generated by way of concurrent exposure of a target measurement site of the sample to each of a bias magnetic field and radiation (e.g., microwave or radio frequency radiation) produced by a first set of integrated waveguides. A response signal corresponding to a behavior of spinwaves within the target measurement site can be generated by way of a second set of integrated waveguides.
    Type: Application
    Filed: September 6, 2013
    Publication date: April 10, 2014
    Applicant: NATIONAL UNIVERSITY OF SINGAPORE
    Inventors: Hyunsoo YANG, Sankha Subhra MUKHERJEE, Jae Hyun KWON