Patents by Inventor Subhrajit Roychowdhury

Subhrajit Roychowdhury has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11951566
    Abstract: A method, medium, and system to obtain an assignment of one of a plurality of different additive manufacturing (AM) print parameter sets to each of a plurality of 3D volume elements forming a representation of the model of the part; define a plurality of groupings based on margin parameter values associated with the model of the part; assign a print parameter set to each grouping; automatically assign each of the plurality of print parameter sets to a laser of a multi-laser AM device; save a record of the determined print parameter sets to laser assignments; and transmit the record of the determined print parameter sets to laser assignments to an AM controller to control the multi-laser AM device to generate the part based on the model of the part and the determined print parameter sets to laser assignments, the generated part to be built in a single build.
    Type: Grant
    Filed: July 31, 2019
    Date of Patent: April 9, 2024
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Christina Margaret Vasil, Subhrajit Roychowdhury, Arvind Rangarajan, Joshua Mook
  • Publication number: 20230410412
    Abstract: Methods and apparatus for sensor-based part development are disclosed. An example apparatus includes at least one memory, instructions in the apparatus, and processor circuitry to execute the instructions to translate at least one user-defined material property selection into a desired process observable, the desired process observable including a meltpool property, perform voxel-based autozoning of an input part geometry, the input part geometry based on a computer-generated design, and output a voxelized reference map for the input part geometry based on the desired process observable and the voxel-based autozoning.
    Type: Application
    Filed: June 14, 2022
    Publication date: December 21, 2023
    Inventors: Subhrajit Roychowdhury, Rogier Sebastiaan Blom, Steven J. Duclos, Anthony J. Vinciquerra, Xiaohu Ping, Voramon S. Dheeradhada
  • Publication number: 20230400833
    Abstract: Methods and apparatus for sensor-based part development are disclosed. An example apparatus includes at least one memory, instructions in the apparatus, and processor circuitry to execute the instructions to identify a reference process observable of a computer-generated part, receive input from at least one sensor during three-dimensional printing to identify an estimated process observable using feature extraction, and adjust at least one three-dimensional printing process parameter to reduce an error identified from a mismatch between the estimated process observable and the reference process observable.
    Type: Application
    Filed: June 14, 2022
    Publication date: December 14, 2023
    Inventors: Subhrajit Roychowdhury, Naresh S. Iyer, Sanghee Cho, Rogier Sebastiaan Blom, Brent Brunell, Xiaohu Ping, Sharath Aramanekoppa
  • Publication number: 20230305196
    Abstract: A system includes a first group of optic lenses within a focusing unit positioned along the propagation direction of a collimated laser beam, the first group of optic lenses separated by a predetermined fixed distance. The first group of optic lenses in conjunction cause the collimated beam to form as an annular beam as it passes through the first group of optic lenses. An axicon lens located distal from the first group of optic lenses along the propagation direction, the axicon lens operable to bifurcate the annular beam into two deflected collimated beam sections, and the axicon lens having a focus that causes the two deflected collimated beam sections to merge at a distance distal from the axicon lens to create an interference pattern region.
    Type: Application
    Filed: May 22, 2023
    Publication date: September 28, 2023
    Inventors: Robert John Filkins, Subhrajit Roychowdhury, Juan Borja, Thomas Adcock
  • Publication number: 20230300170
    Abstract: Systems and methods for power system switching element (PSSE) anomaly detection are disclosed. An example PSSE anomaly detection unit may include a power system switching element position estimator (PSSEPE) and a comparison unit. The PSSEPE may be configured to receive a set of measurements and a set of control commands associated with a PSSE, calculate an anomaly confidence score based on the set of measurements and the set of control commands, and estimate a calculated PSSE position based on the set of measurements and the set of control commands. The comparison unit may be configured to receive the calculated PSSE position from the PSSEPE, receive the set of measurements and the set of control commands from the PSSEPE, receive a reported PSSE position associated with the PSSE, and determine a PSSE anomaly decision based on a difference between the reported PSSE position and the calculated PSSE position.
    Type: Application
    Filed: March 16, 2022
    Publication date: September 21, 2023
    Applicant: General Electric Technology GmbH
    Inventors: Masoud ABBASZADEH, Mitalkumar KANABAR, Subhrajit ROYCHOWDHURY, Pubudu Eroshan WEERATHUNGA, Balakrishna PAMULAPARTHY
  • Patent number: 11729190
    Abstract: An industrial asset may have monitoring nodes that generate current monitoring node values. A dynamic, resilient estimator may split a temporal monitoring node space into normal and one or more abnormal subspaces associated with different kinds of attack vectors. According to some embodiments, a neutralization model is constructed and trained for each attack vector using supervised learning and the associated abnormal subspace. In other embodiments, a single model is created using out-of-range values for abnormal monitoring nodes. Responsive to an indication of a particular abnormal monitoring node or nodes, the system may automatically invoke the appropriate neutralization model to determine estimated values of the particular abnormal monitoring node or nodes (e.g., by selecting the correct model or using out-of-range values). The series of current monitoring node values from the abnormal monitoring node or nodes may then be replaced with the estimated values.
    Type: Grant
    Filed: October 29, 2019
    Date of Patent: August 15, 2023
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Subhrajit Roychowdhury, Masoud Abbaszadeh, Mustafa Tekin Dokucu
  • Patent number: 11686889
    Abstract: A system includes a first group of optic lenses within a focusing unit positioned along the propagation direction of a collimated laser beam, the first group of optic lenses separated by a predetermined fixed distance. The first group of optic lenses in conjunction cause the collimated beam to form as an annular beam as it passes through the first group of optic lenses. An axicon lens located distal from the first group of optic lenses along the propagation direction, the axicon lens operable to bifurcate the annular beam into two deflected collimated beam sections, and the axicon lens having a focus that causes the two deflected collimated beam sections to merge at a distance distal from the axicon lens to create an interference pattern region.
    Type: Grant
    Filed: February 28, 2019
    Date of Patent: June 27, 2023
    Assignee: General Electric Company
    Inventors: Robert John Filkins, Subhrajit Roychowdhury, Juan Borja, Thomas Adcock
  • Patent number: 11609549
    Abstract: According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a part parameter dictionary module comprising a processor, geometry data for a plurality of geometric structures forming a plurality of parts, wherein the parts are manufactured with an additive manufacturing machine; determining, using the processor of the part parameter dictionary module, a feature set for each geometric structure; generating, using the processor of the part parameter dictionary module, one of a coupon and a coupon set for the feature set; generating an optimized parameter set for each coupon, using the processor of the part parameter dictionary module, via execution of an iterative learning control process for each coupon; mapping, using the processor of the part parameter dictionary module, one or more parameters of the optimized parameter set to one or more features of the feature set; and generating a dictionary of optimized scan parameter sets to fabricate geometric str
    Type: Grant
    Filed: June 28, 2021
    Date of Patent: March 21, 2023
    Assignee: General Electric Company
    Inventors: Subhrajit Roychowdhury, Alexander Chen, Xiaohu Ping, John Erik Hershey
  • Publication number: 20230071394
    Abstract: The present disclosure relates to techniques for detecting cyber-faults in industrial assets. Such techniques may include obtaining an input dataset from a plurality of nodes of industrial assets and predicting fault nodes in the plurality of nodes by inputting the input dataset to a one-class classifier. The one-class classifier may be trained on normal operation data obtained during normal operations of the industrial assets. Further, the cyber-fault detection techniques may include computing a confidence level of cyber fault detection for the input dataset using the one-class classifier and adjusting decision thresholds based on the confidence level for categorizing the input dataset as normal or including cyber-faults. The predicted fault nodes and the adjusted decision thresholds may be used for detecting cyber-faults in the plurality of nodes of the industrial assets.
    Type: Application
    Filed: August 19, 2021
    Publication date: March 9, 2023
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Subhrajit ROYCHOWDHURY, Masoud ABBASZADEH, Georgios BOUTSELIS, Joel MARKHAM
  • Publication number: 20230075736
    Abstract: The present disclosure provides techniques for implementing self-adapting neutralization against cyber-faults within industrial assets. The disclosed neutralization techniques may include obtaining an input dataset from a plurality of nodes of industrial assets and reconstructing compromised nodes in the plurality of nodes to neutralize cyber-faults detected based on the input dataset. A confidence metric may be computed for the reconstruction of the compromised nodes, e.g., using inductive conformal prediction. Based on the confidence metric and the reconstruction of the compromised nodes, input signals from the reconstruction of the compromised nodes may be transformed, or configuration parameters for a controller of the industrial assets may be tuned.
    Type: Application
    Filed: August 19, 2021
    Publication date: March 9, 2023
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Subhrajit ROYCHOWDHURY, Masoud ABBASZADEH, Georgios BOUTSELIS, Joel MARKHAM
  • Publication number: 20230046049
    Abstract: An additive manufacturing apparatus, a computing system, and a method for operating an additive manufacturing apparatus are provided. The method includes obtaining two or more images corresponding to respective build layers at a build plate, wherein each image comprises a plurality of data points comprising a feature and corresponding location at the build plate; removing variation between the features of the plurality of data points; and normalizing each feature to remove location dependence in the plurality of data points.
    Type: Application
    Filed: August 10, 2021
    Publication date: February 16, 2023
    Inventors: Saikat K. Ray Majumder, Naresh S. Iyer, Xiaohu Ping, Subhrajit Roychowdhury
  • Patent number: 11580430
    Abstract: Determining a quality score for a part manufactured by an additive manufacturing machine based on build parameters and sensor data without the need for extensive physical testing of the part. Sensor data is received from the additive manufacturing machine during manufacture of the part using a first set of build parameters. The first set of build parameters is received. A first algorithm is applied to the first set of build parameters and the received sensor data to generate a quality score. The first algorithm is trained by receiving a reference derived from physical measurements performed on at least one reference part built using a reference set of build parameters. The quality score is output via the communication interface of the device.
    Type: Grant
    Filed: January 25, 2019
    Date of Patent: February 14, 2023
    Assignee: General Electric Company
    Inventors: Lembit Salasoo, Vipul K. Gupta, Xiaohu Ping, Subhrajit Roychowdhury, Justin Gambone, Jr., Naresh Iyer, Xiaolei Shi, Mengli Wang
  • Publication number: 20230029806
    Abstract: According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a parameter development module comprising a processor, a defined geometry for one or more parts, wherein the parts are manufactured with an additive manufacturing machine, and wherein a stack is formed from one or more parts; fabricating the one or more parts with the additive manufacturing machine based on a first parameter set; collecting in-situ monitoring data from one or more in-situ monitoring systems of the additive manufacturing machine for one or more parts; determining whether each stack should receive an additional part based on an analysis of the collected in-situ monitoring data; and fabricating each additional part based on the determination the stack should receive the additional part. Numerous other aspects are provided.
    Type: Application
    Filed: October 17, 2022
    Publication date: February 2, 2023
    Inventors: Vipul Kumar GUPTA, Natarajan CHENNIMALAI KUMAR, Anthony Joseph VINCIQUERRA, Laura Cerully DIAL, Voramon Supatarawanich DHEERADHADA, Timothy HANLON, Lembit SALASOO, Xiaohu PING, Subhrajit ROYCHOWDHURY, Justin John GAMBONE
  • Patent number: 11481664
    Abstract: A method of transferring operational parameter sets between different domains of additive manufacturing machines includes creating a first machine domain parameter set in a first machine domain, accessing a model of a second additive manufacturing in a second machine domain, creating a second machine domain parameter set by applying transfer learning techniques including learning differences between the first machine domain and the second machine domain, adjusting the first machine domain parameter set using the differences before incorporation into the second machine domain to obtain the second machine domain parameter set, the second machine domain parameter set representing operational settings for the second additive manufacturing machine, the second additive manufacturing machine producing a product sample, determining if the product sample is within quality assurance metrics, and if the product sample is not within the quality assurance metrics, adjusting the second machine domain parameter set.
    Type: Grant
    Filed: September 5, 2018
    Date of Patent: October 25, 2022
    Assignee: General Electric Company
    Inventors: Subhrajit Roychowdhury, Naresh Iyer
  • Patent number: 11472115
    Abstract: According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a parameter development module comprising a processor, a defined geometry for one or more parts, wherein the parts are manufactured with an additive manufacturing machine, and wherein a stack is formed from one or more parts; fabricating the one or more parts with the additive manufacturing machine based on a first parameter set; collecting in-situ monitoring data from one or more in-situ monitoring systems of the additive manufacturing machine for one or more parts; determining whether each stack should receive an additional part based on an analysis of the collected in-situ monitoring data; and fabricating each additional part based on the determination the stack should receive the additional part. Numerous other aspects are provided.
    Type: Grant
    Filed: March 21, 2019
    Date of Patent: October 18, 2022
    Assignee: General Electric Company
    Inventors: Vipul Kumar Gupta, Natarajan Chennimalai Kumar, Anthony Joseph Vinciquerra, Laura Cerully Dial, Voramon Supatarawanich Dheeradhada, Timothy Hanlon, Lembit Salasoo, Xiaohu Ping, Subhrajit Roychowdhury, Justin John Gambone
  • Patent number: 11468164
    Abstract: An industrial asset may have monitoring nodes (e.g., sensor or actuator nodes) that generate current monitoring node values. An abnormality detection and localization computer may receive the series of current monitoring node values and output an indication of at least one abnormal monitoring node that is currently being attacked or experiencing a fault. An actor-critic platform may tune a dynamic, resilient state estimator for a sensor node and output tuning parameters for a controller that improve operation of the industrial asset during the current attack or fault. The actor-critic platform may include, for example, a dynamic, resilient state estimator, an actor model, and a critic model. According to some embodiments, a value function of the critic model is updated for each action of the actor model and each action of the actor model is evaluated by the critic model to update a policy of the actor-critic platform.
    Type: Grant
    Filed: December 11, 2019
    Date of Patent: October 11, 2022
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Subhrajit Roychowdhury, Masoud Abbaszadeh, Mustafa Tekin Dokucu
  • Patent number: 11411983
    Abstract: An industrial asset may have monitoring nodes that generate current monitoring node values. An abnormality detection computer may determine that an abnormal monitoring node is currently being attacked or experiencing fault. A dynamic, resilient estimator constructs, using normal monitoring node values, a latent feature space (of lower dimensionality as compared to a temporal space) associated with latent features. The system also constructs, using normal monitoring node values, functions to project values into the latent feature space. Responsive to an indication that a node is currently being attacked or experiencing fault, the system may compute optimal values of the latent features to minimize a reconstruction error of the nodes not currently being attacked or experiencing a fault. The optimal values may then be projected back into the temporal space to provide estimated values and the current monitoring node values from the abnormal monitoring node are replaced with the estimated values.
    Type: Grant
    Filed: October 16, 2019
    Date of Patent: August 9, 2022
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Mustafa Tekin Dokucu, Subhrajit Roychowdhury, Olugbenga Anubi, Masoud Abbaszadeh, Justin Varkey John
  • Publication number: 20220245048
    Abstract: Generating fault indications for an additive manufacturing machine based on a comparison of the outputs of multiple process models to measured sensor data. The method receiving sensor data from the additive manufacturing machine during manufacture of at least one part. Models are selected from a model database, each model generating expected sensor values for a defined condition. Difference values are computed between the received sensor data and an output of each of the models. A probability density function is computed, which defines, for each of the models, a likelihood that a given difference value corresponds to each respective model. A probabilistic rule is applied to determine, for each of the models, a probability that the corresponding model output matches the received sensor data. An indicator is output of a defined condition corresponding to a model having the highest match probability.
    Type: Application
    Filed: April 20, 2022
    Publication date: August 4, 2022
    Inventors: Harry Kirk MATHEWS, JR., Sarah FELIX, Subhrajit ROYCHOWDHURY, Saikat RAY MAJUMDER, Thomas SPEARS
  • Patent number: 11327870
    Abstract: Generating fault indications for an additive manufacturing machine based on a comparison of the outputs of multiple process models to measured sensor data. The method receiving sensor data from the additive manufacturing machine during manufacture of at least one part. Models are selected from a model database, each model generating expected sensor values for a defined condition. Difference values are computed between the received sensor data and an output of each of the models. A probability density function is computed, which defines, for each of the models, a likelihood that a given difference value corresponds to each respective model. A probabilistic rule is applied to determine, for each of the models, a probability that the corresponding model output matches the received sensor data. An indicator is output of a defined condition corresponding to a model having the highest match probability.
    Type: Grant
    Filed: January 8, 2019
    Date of Patent: May 10, 2022
    Assignee: General Electric Company
    Inventors: Harry Kirk Mathews, Jr., Sarah Felix, Subhrajit Roychowdhury, Saikat Ray Majumder, Thomas Spears
  • Publication number: 20210325849
    Abstract: According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a part parameter dictionary module comprising a processor, geometry data for a plurality of geometric structures forming a plurality of parts, wherein the parts are manufactured with an additive manufacturing machine; determining, using the processor of the part parameter dictionary module, a feature set for each geometric structure; generating, using the processor of the part parameter dictionary module, one of a coupon and a coupon set for the feature set; generating an optimized parameter set for each coupon, using the processor of the part parameter dictionary module, via execution of an iterative learning control process for each coupon; mapping, using the processor of the part parameter dictionary module, one or more parameters of the optimized parameter set to one or more features of the feature set; and generating a dictionary of optimized scan parameter sets to fabricate geometric str
    Type: Application
    Filed: June 28, 2021
    Publication date: October 21, 2021
    Inventors: Subhrajit ROYCHOWDHURY, Alexander CHEN, Xiaohu PING, John Erik HERSHEY