Patents by Inventor Subramanian Chebiyam

Subramanian Chebiyam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automatically generated schematics and visualization
    Patent number: 10621298
    Abstract: An automated visualization tool in a command line environment allows complex log data to be represented by symbols and associated information for clarity of communication and better understanding of the associated design.
    Type: Grant
    Filed: October 26, 2016
    Date of Patent: April 14, 2020
    Assignee: Synopsys, Inc.
    Inventors: Anshuman Chandra, Subramanian Chebiyam, Rohit Kapur
  • Command coverage analyzer
    Patent number: 10445225
    Abstract: A method and apparatus of a novel command coverage analyzer is disclosed. Combinations of commands, options, arguments, and values of a product are extracted, customer environment and uses are considered, and a more comprehensive and accurate quality of software process and metric is provided.
    Type: Grant
    Filed: May 17, 2016
    Date of Patent: October 15, 2019
    Assignee: Synopsys, Inc.
    Inventors: Chandramouli Gopalakrishnan, Subramanian Chebiyam, Neeraj Surana, Santosh Kulkarni, Rohit Kapur
  • Handling of undesirable distribution of unknown values in testing of circuit using automated test equipment
    Patent number: 10067187
    Abstract: A method for masking scan chains in a test circuit of an integrated circuit is disclosed. The test circuit includes multiple mask banks. Different mask patterns are stored in each of the mask banks. A first mask bank of the multiple mask banks is selected and the mask pattern stored in the selected first mask bank is used for masking the output of the scan chains of the test circuit during a first portion of a test cycle. A second mask bank of the multiple mask banks is selected and the ask pattern stored in the selected second mask bank is used for masking the output of the scan chains of the test circuit during a second portion of the test cycle.
    Type: Grant
    Filed: July 18, 2014
    Date of Patent: September 4, 2018
    Assignee: Synopsys, Inc.
    Inventors: Anshuman Chandra, Subramanian Chebiyam, Jyotirmoy Saikia, Parthajit Bhattacharya, Rohit Kapur
  • COMMAND COVERAGE ANALYZER
    Publication number: 20180107587
    Abstract: A method and apparatus of a novel command coverage analyzer is disclosed. Combinations of commands, options, arguments, and values of a product are extracted, customer environment and uses are considered, and a more comprehensive and accurate quality of software process and metric is provided.
    Type: Application
    Filed: May 17, 2016
    Publication date: April 19, 2018
    Inventors: Chandramouli Gopalakrishnan, Subramanian Chebiyam, Neeraj Surana, Santosh Kulkarni, Rohit Kapur
  • AUTOMATICALLY GENERATED SCHEMATICS AND VISUALIZATION
    Publication number: 20170116364
    Abstract: An automated visualization tool in a command line environment allows complex log data to be represented by symbols and associated information for clarity of communication and better understanding of the associated design.
    Type: Application
    Filed: October 26, 2016
    Publication date: April 27, 2017
    Inventors: Anshuman Chandra, Subramanian Chebiyam, Rohit Kapur
  • Command coverage analyzer
    Patent number: 9342439
    Abstract: A method and apparatus of a novel command coverage analyzer is disclosed. Combinations of commands, options, arguments, and values of a product are extracted, customer environment and uses are considered, and a more comprehensive and accurate quality of software process and metric is provided.
    Type: Grant
    Filed: June 11, 2015
    Date of Patent: May 17, 2016
    Assignee: Synopsys, Inc.
    Inventors: Chandramouli Gopalakrishnan, Subramanian Chebiyam, Neeraj Surana, Santosh Kulkarni, Rohit Kapur
  • COMMAND COVERAGE ANALYZER
    Publication number: 20150363295
    Abstract: A method and apparatus of a novel command coverage analyzer is disclosed. Combinations of commands, options, arguments, and values of a product are extracted, customer environment and uses are considered, and a more comprehensive and accurate quality of software process and metric is provided.
    Type: Application
    Filed: June 11, 2015
    Publication date: December 17, 2015
    Inventors: Chandramouli Gopalakrishnan, Subramanian Chebiyam, Neeraj Surana, Santosh Kulkarni, Rohit Kapur
  • Handling of Undesirable Distribution of Unknown Values in Testing of Circuit Using Automated Test Equipment
    Publication number: 20150025819
    Abstract: A method for masking scan chains in a test circuit of an integrated circuit is disclosed. The test circuit includes multiple mask banks. Different mask patterns are stored in each of the mask banks. A first mask bank of the multiple mask banks is selected and the mask pattern stored in the selected first mask bank is used for masking the output of the scan chains of the test circuit during a first portion of a test cycle. A second mask bank of the multiple mask banks is selected and the ask pattern stored in the selected second mask bank is used for masking the output of the scan chains of the test circuit during a second portion of the test cycle.
    Type: Application
    Filed: July 18, 2014
    Publication date: January 22, 2015
    Inventors: Anshuman Chandra, Subramanian Chebiyam, Jyotirmoy Saikia, Parthajit Bhattacharya, Rohit Kapur