Abstract: Disclosed is a method of providing adjustment data for a droplet deposition head (such as a printhead), or a data processing component therefor. The method makes use of test data, which has been collected by operating the droplet deposition head (or a test droplet deposition head of substantially the same construction, e.g from the same batch), using a set of test waveforms, at a number of frequencies within a test range, and by recording the volume and velocity of the thus-ejected droplets, with these recorded values (volr, velr) being represented within the test data. Each of the set of test waveforms includes a basic drive waveform and a number of adjusted drive waveforms, each of which corresponds to the basic drive waveform, but with a particular waveform parameter adjusted by a corresponding amount. This waveform parameter is a continuous variable, such as pulse width or pulse amplitude.

Abstract: Disclosed is a method of providing adjustment data for a droplet deposition head (such as a printhead), or a data processing component therefor. The method makes use of test data, which has been collected by operating the droplet deposition head (or a test droplet deposition head of substantially the same construction, e.g from the same batch), using a set of test waveforms, at a number of frequencies within a test range, and by recording the volume and velocity of the thus-ejected droplets, with these recorded values (volr, velr) being represented within the test data. Each of the set of test waveforms includes a basic drive waveform and a number of adjusted drive waveforms, each of which corresponds to the basic drive waveform, but with a particular waveform parameter adjusted by a corresponding amount. This waveform parameter is a continuous variable, such as pulse width or pulse amplitude.