Patents by Inventor Sudhakaran Sreepad

Sudhakaran Sreepad has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for compensating for an influence of a magnetic interference source on a measurement of a magnetic field sensor in a device and a device
    Patent number: 11619683
    Abstract: A method and device for compensating for an influence of a magnetic interference source on a measurement of a magnetic field sensor in a device. In the method, a magnetic flux density M1 measured with the magnetic field sensor at a measured ambient temperature Tk is compensated for with a compensation factor Minterference of the magnetic interference source according to M=M1?Minterference, where Minterference=M0+aM0(T?k?T0) and M0 is a magnetic reference flux density relative to a reference temperature T0, a corresponding to a material parameter, which is defined for a used magnet material of the magnetic interference source, and the measured ambient temperature Tk being corrected using a non-linear delay parameter to a temperature of the magnetic interference source T?k. The method is used for the axis-based compensation of a temperature drift, the material parameter a being determined individually for each Cartesian axis.
    Type: Grant
    Filed: November 22, 2021
    Date of Patent: April 4, 2023
    Assignee: ROBERT BOSCH GMBH
    Inventors: Rui Zhang, Sudhakaran Sreepad, Parambath Muhammad
  • METHOD FOR COMPENSATING FOR AN INFLUENCE OF A MAGNETIC INTERFERENCE SOURCE ON A MEASUREMENT OF A MAGNETIC FIELD SENSOR IN A DEVICE AND A DEVICE
    Publication number: 20220170999
    Abstract: A method and device for compensating for an influence of a magnetic interference source on a measurement of a magnetic field sensor in a device. In the method, a magnetic flux density M1 measured with the magnetic field sensor at a measured ambient temperature Tk is compensated for with a compensation factor Minterference of the magnetic interference source according to M=M1?Minterference, where Minterference=M0+aM0(T?k?T0) and M0 is a magnetic reference flux density relative to a reference temperature T0, a corresponding to a material parameter, which is defined for a used magnet material of the magnetic interference source, and the measured ambient temperature Tk being corrected using a non-linear delay parameter to a temperature of the magnetic interference source T?k. The method is used for the axis-based compensation of a temperature drift, the material parameter a being determined individually for each Cartesian axis.
    Type: Application
    Filed: November 22, 2021
    Publication date: June 2, 2022
    Inventors: Rui Zhang, Sudhakaran Sreepad, Parambath Muhammad