Patents by Inventor Sudhir S. Kudva

Sudhir S. Kudva has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Data processing device and methods thereof
    Patent number: 7724015
    Abstract: A data processing device includes a first memory for use during normal operation of the device and a second memory for use during testing. The second memory stores a set of test patterns for testing of a functional module. When the data processing device is in a normal (i.e. non-test) mode of operation, data is retrieved from a first memory based on a received memory address. The retrieved data is applied to the functional module of the data processing device to perform a designated function. When the data processing device is in a test mode of operation, received memory addresses are provided to the second memory for retrieval of a test pattern associated with the address. The test pattern is applied to the functional module to generate an output pattern. The result of a test is determined by comparing the output pattern to an expected pattern.
    Type: Grant
    Filed: October 17, 2008
    Date of Patent: May 25, 2010
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Srinivasan Srinath, Sudhir S. Kudva, Joel T. Irby
  • DATA PROCESSING DEVICE AND METHODS THEREOF
    Publication number: 20100079162
    Abstract: A data processing device includes a first memory for use during normal operation of the device and a second memory for use during testing. The second memory stores a set of test patterns for testing of a functional module. When the data processing device is in a normal (i.e. non-test) mode of operation, data is retrieved from a first memory based on a received memory address. The retrieved data is applied to the functional module of the data processing device to perform a designated function. When the data processing device is in a test mode of operation, received memory addresses are provided to the second memory for retrieval of a test pattern associated with the address. The test pattern is applied to the functional module to generate an output pattern. The result of a test is determined by comparing the output pattern to an expected pattern.
    Type: Application
    Filed: October 17, 2008
    Publication date: April 1, 2010
    Applicant: ADVANCED MICRO DEVICES, INC.
    Inventors: Srinivasan Srinath, Sudhir S. Kudva, Joel T. Irby