Abstract: A test definer, a method for automatically determining functional tests for a printed circuit board (PCB) having analog components and a test system. In one embodiment, the test definer includes: (1) a circuit builder configured to generate a representative circuit of the PCB based on schematic information thereof, (2) a circuit organizer configured to partition the representative circuit into testable sub-circuits and (3) a specification generator configured to automatically determine functionality tests for the PCB based on the sub-circuits, obtain expected values from the functionality tests and generate platform-independent specifications representing the functionality tests and the expected values.

Abstract: A socket signal extender (SSE), and a system and method of testing an assembled device under test (DUT) board employing an SSE. In one embodiment, the SSE includes a cover having a portion configured to fit within a test socket. The portion is free of logic and includes electrical conductors configured to provide an electrical connection to contacts of the test socket.