Abstract: A machine learning (ML) based asset monitoring system that automatically determines damage mechanisms (DMs) and generates automatically updated visualizations of assets that include equipment and lines of a processing plant is disclosed. The asset monitoring system is communicatively coupled to the assets of the plant and continuously receives process parameters associated with the various processes and equipment in the plant. Corrosion loops (CLs) are identified and automatically demarcated by the asset monitoring system. DMs are predicted for each of the assets using a ML model based on the process parameters and the corrosion loops. The data regarding the DMs, CLs and the process parameters are used to obtain equipment risk rankings for the assets. Multi-dimensional visualizations of the assets that display the state of the plant assets in real-time are generated.

Abstract: A machine learning (ML) based asset monitoring system that automatically determines damage mechanisms (DMs) and generates automatically updated visualizations of assets that include equipment and lines of a processing plant is disclosed. The asset monitoring system is communicatively coupled to the assets of the plant and continuously receives process parameters associated with the various processes and equipment in the plant. Corrosion loops (CLs) are identified and automatically demarcated by the asset monitoring system. DMs are predicted for each of the assets using a ML model based on the process parameters and the corrosion loops. The data regarding the DMs, CLs and the process parameters are used to obtain equipment risk rankings for the assets. Multi-dimensional visualizations of the assets that display the state of the plant assets in real-time are generated.

Abstract: In an imaging array having a plurality of pixel sensors arranged in a plurality of rows and columns, pixel data being read out on column lines of the array, a column line voltage clamp circuit for column lines of the array includes a master voltage clamp circuit coupled to provide a reference voltage clamp level on a reference node, and a slave voltage clamp circuit coupled to each column line in the imaging array, each slave voltage clamp circuit configured to clamp voltage on the column line to a column voltage clamp level derived from the reference voltage level.

Abstract: In an imaging array having a plurality of pixel sensors arranged in a plurality of rows and columns, pixel data being read out on column lines of the array, a column line voltage clamp circuit for column lines of the array includes a master voltage clamp circuit coupled to provide a reference voltage clamp level on a reference node, and a slave voltage clamp circuit coupled to each column line in the imaging array, each slave voltage clamp circuit configured to clamp voltage on the column line to a column voltage clamp level derived from the reference voltage level.