Patents by Inventor Sudripto De

Sudripto De has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for root cause analysis of the failure of a manufactured product
    Patent number: 8489530
    Abstract: A system, method and computer program product for the root cause analysis of the failure of a manufactured product is disclosed. The present invention includes the development of a knowledge model, based on information obtained from historical warranty claim forms and various manufacturing data sources. The invention also includes processing text information in a free-form text that is obtained from warranty claim forms by using text-tagging and annotation techniques. Thereafter, the knowledge model is converted to a Bayesian network. The present invention provides a user interface to select parameters and corresponding instances from current warranty claim forms. The selected parameters and corresponding instances are used as input evidence for the Bayesian network. The present invention facilitates the process of drawing inferences for root cause analysis of the failure of manufactured products and corresponding probabilities.
    Type: Grant
    Filed: December 3, 2008
    Date of Patent: July 16, 2013
    Assignee: Infosys Limited
    Inventors: Sudripto De, Srinivas Narasimhamurthy, Ashish Sureka, Satyabrata Pradhan
  • System and method for root cause analysis of the failure of a manufactured product
    Publication number: 20090150325
    Abstract: A system, method and computer program product for the root cause analysis of the failure of a manufactured product is disclosed. The present invention includes the development of a knowledge model, based on information obtained from historical warranty claim forms and various manufacturing data sources. The invention also includes processing text information in a free-form text that is obtained from warranty claim forms by using text-tagging and annotation techniques. Thereafter, the knowledge model is converted to a Bayesian network. The present invention provides a user interface to select parameters and corresponding instances from current warranty claim forms. The selected parameters and corresponding instances are used as input evidence for the Bayesian network. The present invention facilitates the process of drawing inferences for root cause analysis of the failure of manufactured products and corresponding probabilities.
    Type: Application
    Filed: December 3, 2008
    Publication date: June 11, 2009
    Applicant: Infosys Technologies Ltd.
    Inventors: Sudripto De, Srinivas Narasimhamurthy, Ashish Sureka, Satyabrata Pradhan