Patents by Inventor Suguru IRIE

Suguru IRIE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210223028
    Abstract: An optical measurement apparatus including: an irradiation optical system configured to irradiate a measurement subject with irradiation light that includes a plurality of wavelengths; a reception optical system configured to receive measurement light that is transmission light or reflection light travelling from the measurement subject as a result of the measurement subject being irradiated with the irradiation light; and a polarizing plate, wherein the polarizing plate is configured to be able to be provided in either the irradiation optical system or the reception optical system.
    Type: Application
    Filed: December 11, 2020
    Publication date: July 22, 2021
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Kunikazu TAGUCHI, Suguru IRIE
  • Patent number: 9163985
    Abstract: A spectral characteristic measurement apparatus includes a spectrometer for spatially dispersing incident light depending on wavelengths and a detection portion for receiving light dispersed by the spectrometer. The detection portion includes a first detection area on which a component in a first wavelength range is incident and a second detection area on which a component in a second wavelength range is incident. The apparatus includes a correction portion for correcting stray light detected by the detection portion derived from light to be measured. The correction portion corrects a stray light pattern based on a first amount of change with respect to wavelengths in the first wavelength range of the stray light pattern and a second amount of change with respect to wavelengths included in a result of detection in the first detection area of the detection portion, to calculate a stray light component derived from the light to be measured.
    Type: Grant
    Filed: August 26, 2013
    Date of Patent: October 20, 2015
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki Sano, Suguru Irie, Tsutomu Mizuguchi
  • Publication number: 20140063497
    Abstract: A spectral characteristic measurement apparatus includes a spectrometer for spatially dispersing incident light depending on wavelengths and a detection portion for receiving light dispersed by the spectrometer. The detection portion includes a first detection area on which a component in a first wavelength range is incident and a second detection area on which a component in a second wavelength range is incident. The apparatus includes a correction portion for correcting stray light detected by the detection portion derived from light to be measured. The correction portion corrects a stray light pattern based on a first amount of change with respect to wavelengths in the first wavelength range of the stray light pattern and a second amount of change with respect to wavelengths included in a result of detection in the first detection area of the detection portion, to calculate a stray light component derived from the light to be measured.
    Type: Application
    Filed: August 26, 2013
    Publication date: March 6, 2014
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki SANO, Suguru IRIE, Tsutomu MIZUGUCHI