Patents by Inventor Suman Kanjilal

Suman Kanjilal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • VLSI circuits designed for testability and methods for producing them
    Patent number: 5461573
    Abstract: A VLSI circuit including memory is viewed as a finite state object machine and for testability a finite state test machine is embedded in the finite state object machine. To make the embedding practiced, the object test machine is partitioned into components and separate test machines are embedded into each component. The augmented components are then interconnected to form a composite machine for testing. To have the same test generation complexity as the object machine with a single embedded test function, there are special relations that have to be satisfied in the manner in which the test machines are embedded.
    Type: Grant
    Filed: September 20, 1993
    Date of Patent: October 24, 1995
    Assignees: NEC USA, Inc., Rutgers University, AT&T Corp.
    Inventors: Srimat T. Chakradhar, Suman Kanjilal, Vishwani Agrawal