Abstract: In described examples of circuitry and methods for testing multiple memories, a controller generates a sequence of commands to be applied to one or more of the memories, where each given command includes expected data, and a command address. Local adapters are individually coupled with the controller and with an associated memory. Each local adapter translates the command to a memory type of the associated memory, maps the command address to a local address of the associated memory, and provides test results to the controller according to read data from the local address of the associated memory and the expected data of the command.

Abstract: In described examples of circuitry and methods for testing multiple memories, a controller generates a sequence of commands to be applied to one or more of the memories, where each given command includes expected data, and a command address. Local adapters are individually coupled with the controller and with an associated memory. Each local adapter translates the command to a memory type of the associated memory, maps the command address to a local address of the associated memory, and provides test results to the controller according to read data from the local address of the associated memory and the expected data of the command.

Abstract: Apparatus and method for testing an integrated circuit. An integrated circuit includes circuitry to be tested, scan chain logic, and a test adapter. The scan chain logic is configured to transfer test data to and test results from the circuitry. The test adapter is configured to extract the test data from a packet received from an automated test control system and to transfer the test data to the scan chain logic. The test adapter is also configured to receive the test results from the scan chain logic, and to packetize the test result for transmission to the automated test control system.

Abstract: Apparatus and method for testing an integrated circuit. An integrated circuit includes circuitry to be tested, scan chain logic, and a test adapter. The scan chain logic is configured to transfer test data to and test results from the circuitry. The test adapter is configured to extract the test data from a packet received from an automated test control system and to transfer the test data to the scan chain logic. The test adapter is also configured to receive the test results from the scan chain logic, and to packetize the test result for transmission to the automated test control system.

Abstract: In an embodiment of the invention, a pipelined memory bank is tested by scanning test patterns into an integrated circuit. Test data is formed from the test patterns and shifted into a scan-in chain in the pipelined memory bank. The test data in the scan-in chain is launched into the inputs of the pipelined memory bank during a first clock cycle. Data from the outputs of the pipelined memory bank is captured in a scan-out chain during a second cycle where the time between the first and second clock cycles is equal to or greater than the read latency of the memory bank.

Abstract: In an embodiment of the invention, a pipelined memory bank is tested by scanning test patterns into an integrated circuit. Test data is formed from the test patterns and shifted into a scan-in chain in the pipelined memory bank. The test data in the scan-in chain is launched into the inputs of the pipelined memory bank during a first clock cycle. Data from the outputs of the pipelined memory bank is captured in a scan-out chain during a second cycle where the time between the first and second clock cycles is equal to or greater than the read latency of the memory bank.