Patents by Inventor Sumihiro Maeda

Sumihiro Maeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220326225
    Abstract: Objects to be achieved are to provide a nerve cell with which it is possible to visualize and quantify the intracellular tau without using the exogenous promoter and to provide a pluripotent stem cell with which the nerve cell can be produced, to provide a method of screening a substance, including using the pluripotent stem cell or nerve cell described above, and a substance screened by the above method, and to provide a kit including a targeting vector and a gRNA. There is provided a pluripotent stem cell including a DNA encoding a reporter molecule, the DNA being introduced adjacent to an endogenous tau gene such that a tau protein is expressed as a fusion protein fused with a reporter molecule.
    Type: Application
    Filed: March 31, 2022
    Publication date: October 13, 2022
    Applicants: FUJIFILM Corporation, KEIO UNIVERSITY
    Inventors: Hirokazu TANABE, Setsu ENDOH, Hitoshi MASUYAMA, Euikyung SHIN, Koichi SAITO, Hideyuki OKANO, Sumihiro MAEDA
  • Publication number: 20220315890
    Abstract: An object of the present invention is to provide a nerve cell in which tau aggregation and cell death are caused; a screening kit and a screening method, in which the nerve cell is used; a drug candidate substance obtained by the screening method; a human pluripotent stem cell for producing the nerve cell; and a method of producing the nerve cell. There is provided a nerve cell having an introduced exogenous wild-type tau gene.
    Type: Application
    Filed: March 31, 2022
    Publication date: October 6, 2022
    Applicants: FUJIFILM Corporation, KEIO UNIVERSITY
    Inventors: Hirokazu TANABE, Setsu ENDOH, Hideyuki OKANO, Sumihiro MAEDA
  • Patent number: 8031421
    Abstract: The present invention provides a method for measuring an optimum seeking time and an inspection apparatus using this method capable of measuring and setting an optimum seeking time for inspection of a magnetic disk or magnetic head. The method samples average level differences of sector-wise read signals in positive and negative domains for one round of track and detects a minimum value H and a minimum value L among these differences. The method recalculates the seeking time while changing the settling time. After writing and reading test data, calculates a deviation DEV of average levels DEV=(H?L)/(H+L). The method is adapted to obtain a minimum one of the values of settling time having measured when the deviation DEV of average levels is equal to or less than a predetermined value as an optimum settling time or an optimum seeking time.
    Type: Grant
    Filed: May 27, 2010
    Date of Patent: October 4, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kenichi Shitara, Sumihiro Maeda
  • Patent number: 7903361
    Abstract: In the present invention, an inspection area for sampled defect data is set which has a predetermined width in the radial direction of a magnetic disk and a length round the circle of the magnetic disk in the circumferential direction thereof or a predetermined length in the circumferential direction thereof, and while limiting the defect data in the inspection area and shifting a narrow and long search frame within the area, continuing defects in the region of the search frame are followed up and detected, thereby, only curved line shaped continuing defects having comparatively large curvature near to the circle of the magnetic disk are selectively detected and acquired as circle shaped defects.
    Type: Grant
    Filed: May 21, 2007
    Date of Patent: March 8, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Sumihiro Maeda, Yasuhiro Tokumaru
  • Publication number: 20100302665
    Abstract: The present invention provides a method for measuring an optimum seeking time and an inspection apparatus using this method capable of measuring and setting an optimum seeking time for inspection of a magnetic disk or magnetic head. The method samples average level differences of sector-wise read signals in positive and negative domains for one round of track and detects a minimum value H and a minimum value L among these differences. The method recalculates the seeking time while changing the settling time. After writing and reading test data, calculates a deviation DEV of average levels DEV=(H?L)/(H+L). The method is adapted to obtain a minimum one of the values of settling time having measured when the deviation DEV of average levels is equal to or less than a predetermined value as an optimum settling time or an optimum seeking time.
    Type: Application
    Filed: May 27, 2010
    Publication date: December 2, 2010
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kenichi SHITARA, Sumihiro MAEDA
  • Publication number: 20070271487
    Abstract: In the present invention, an inspection area for sampled defect data is set which has a predetermined width in the radial direction of a magnetic disk and a length round the circle of the magnetic disk in the circumferential direction thereof or a predetermined length in the circumferential direction thereof, and while limiting the defect data in the inspection area and shifting a narrow and long search frame within the area, continuing defects in the region of the search frame are followed up and detected, thereby, only curved line shaped continuing defects having comparatively large curvature near to the circle of the magnetic disk are selectively detected and acquired as circle shaped defects.
    Type: Application
    Filed: May 21, 2007
    Publication date: November 22, 2007
    Inventors: Sumihiro Maeda, Yasuhiro Tokumaru