Patents by Inventor Sumio Kumashiro

Sumio Kumashiro has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9997343
    Abstract: An electrostatic ion trap for mass analysis includes a first array of electrodes and a second array of electrodes, spaced from the first array of electrode. The first and second arrays of electrodes may be planar arrays formed by parallel strip electrodes or by concentric, circular or part-circular electrically conductive rings. The electrodes of the arrays are supplied with substantially the same pattern of voltage whereby the distribution of electrical potential in the space between the arrays is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in the space, focused substantially mid-way between the arrays. Amplifier circuitry is used to detect image current having frequency components related to the mass-to-charge ratio of ions undergoing the periodic, oscillatory motion.
    Type: Grant
    Filed: June 9, 2017
    Date of Patent: June 12, 2018
    Assignee: SHIMADZU CORPORATION
    Inventors: Li Ding, Mikhail Sudakov, Sumio Kumashiro
  • Publication number: 20170278689
    Abstract: An electrostatic ion trap for mass analysis includes a first array of electrodes and a second array of electrodes, spaced from the first array of electrode. The first and second arrays of electrodes may be planar arrays formed by parallel strip electrodes or by concentric, circular or part-circular electrically conductive rings. The electrodes of the arrays are supplied with substantially the same pattern of voltage whereby the distribution of electrical potential in the space between the arrays is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in the space, focused substantially mid-way between the arrays. Amplifier circuitry is used to detect image current having frequency components related to the mass-to-charge ratio of ions undergoing the periodic, oscillatory motion.
    Type: Application
    Filed: June 9, 2017
    Publication date: September 28, 2017
    Inventors: Li DING, Mikhail SUDAKOV, Sumio KUMASHIRO
  • Patent number: 9691596
    Abstract: An electrostatic ion trap for mass analysis includes a first array of electrodes and a second array of electrodes, spaced from the first array of electrode. The first and second arrays of electrodes may be planar arrays formed by parallel strip electrodes or by concentric, circular or part-circular electrically conductive rings. The electrodes of the arrays are supplied with substantially the same pattern of voltage whereby the distribution of electrical potential in the space between the arrays is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in the space, focused substantially mid-way between the arrays. Amplifier circuitry is used to detect image current having frequency components related to the mass-to-charge ratio of ions undergoing the periodic, oscillatory motion.
    Type: Grant
    Filed: October 7, 2015
    Date of Patent: June 27, 2017
    Assignee: SHIMADZU CORPORATION
    Inventors: Li Ding, Mikhail Sudakov, Sumio Kumashiro
  • Publication number: 20160104609
    Abstract: An electrostatic ion trap for mass analysis includes a first array of electrodes and a second array of electrodes, spaced from the first array of electrode. The first and second arrays of electrodes may be planar arrays formed by parallel strip electrodes or by concentric, circular or part-circular electrically conductive rings. The electrodes of the arrays are supplied with substantially the same pattern of voltage whereby the distribution of electrical potential in the space between the arrays is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in the space, focused substantially mid-way between the arrays. Amplifier circuitry is used to detect image current having frequency components related to the mass-to-charge ratio of ions undergoing the periodic, oscillatory motion.
    Type: Application
    Filed: October 7, 2015
    Publication date: April 14, 2016
    Inventors: Li DING, Mikhail SUDAKOV, Sumio KUMASHIRO
  • Patent number: 9159544
    Abstract: An electrostatic ion trap for mass analysis includes a first array of electrodes and a second array of electrodes, spaced from the first array of electrode. The first and second arrays of electrodes may be planar arrays formed by parallel strip electrodes or by concentric, circular or part-circular electrically conductive rings. The electrodes of the arrays are supplied with substantially the same pattern of voltage whereby the distribution of electrical potential in the space between the arrays is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in the space, focused substantially mid-way between the arrays. Amplifier circuitry is used to detect image current having frequency components related to the mass-to-charge ratio of ions undergoing the periodic, oscillatory motion.
    Type: Grant
    Filed: September 28, 2011
    Date of Patent: October 13, 2015
    Assignee: SHIMADZU CORPORATION
    Inventors: Li Ding, Mikhail Sudakov, Sumio Kumashiro
  • Publication number: 20140217275
    Abstract: An electrostatic ion trap for mass analysis includes a first array of electrodes and a second array of electrodes, spaced from the first array of electrode. The first and second arrays of electrodes may be planar arrays formed by parallel strip electrodes or by concentric, circular or part-circular electrically conductive rings. The electrodes of the arrays are supplied with substantially the same pattern of voltage whereby the distribution of electrical potential in the space between the arrays is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in the space, focused substantially mid-way between the arrays. Amplifier circuitry is used to detect image current having frequency components related to the mass-to-charge ratio of ions undergoing the periodic, oscillatory motion.
    Type: Application
    Filed: September 28, 2011
    Publication date: August 7, 2014
    Applicant: SHIMADZU CORPORATION
    Inventors: Li Ding, Mikhail Sudakov, Sumio Kumashiro
  • Patent number: 8704170
    Abstract: The current invention involves a method and a device for generating and analyzing ions in order to analyze samples directly without sample preparation. The gaseous neutral molecules are desorbed under atmospheric pressure by a desorption method. The desorbed neutral molecules are then transferred into a low pressure region where they are post-ionized by a mist from an electrospray probe tip or by photons from a vacuum UV source. The generated ions are then focused in a time varying electric field in the low pressure chamber before they are transferred into a mass spectrometer or ion mobility spectrometer for further analysis.
    Type: Grant
    Filed: April 22, 2011
    Date of Patent: April 22, 2014
    Assignee: Shimadzu Research Laboratory (Shanghai) Co. Ltd.
    Inventors: Sumio Kumashiro, Wenjian Sun, Li Ding
  • Publication number: 20130026359
    Abstract: The current invention involves a method and a device for generating and analyzing ions in order to analyze samples directly without sample preparation. The gaseous neutral molecules are desorbed under atmospheric pressure by a desorption method. The desorbed neutral molecules are then transferred into a low pressure region where they are post-ionized by a mist from an electrospray probe tip or by photons from a vacuum UV source. The generated ions are then focused in a time varying electric field in the low pressure chamber before they are transferred into a mass spectrometer or ion mobility spectrometer for further analysis.
    Type: Application
    Filed: April 22, 2011
    Publication date: January 31, 2013
    Applicant: SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
    Inventors: Sumio Kumashiro, Wenjian Sun, Li Ding
  • Patent number: 8237111
    Abstract: A multi-reflecting ion optical device includes electrostatic field generating means configured to generate electrostatic field defined by a superposition of first and second distributions of electrostatic potential ?EF, ?LS. The first distribution ?EF subjects ions to energy focusing in a flight direction and the second distribution ?LS subjects ions to stability in one lateral direction, to stability in another lateral direction for the duration of at least a finite number of oscillations in the one lateral direction and to subject ions to energy focusing in the one lateral direction for a predetermined energy range.
    Type: Grant
    Filed: June 20, 2008
    Date of Patent: August 7, 2012
    Assignee: Shimadzu Corporation
    Inventors: Uriy Golikov, Konstantin Solovyev, Mikhail Sudakov, Sumio Kumashiro
  • Publication number: 20100193682
    Abstract: A multi-reflecting ion optical device includes electrostatic field generating means configured to generate electrostatic field defined by a superposition of first and second distributions of electrostatic potential ?EF, ?LS. The first distribution ?EF subjects ions to energy focusing in a flight direction and the second distribution ?LS subjects ions to stability in one lateral direction, to stability in another lateral direction for the duration of at least a finite number of oscillations in the one lateral direction and to subject ions to energy focusing in the one lateral direction for a predetermined energy range.
    Type: Application
    Filed: June 20, 2008
    Publication date: August 5, 2010
    Applicant: SHIMADZU CORPORATION
    Inventors: Uriy Golikov, Konstantin Solovyev, Mikhail Sudakov, Sumio Kumashiro
  • Patent number: 5166521
    Abstract: An ion source, a first control electrode for controlling an ion beam emitted by the ion source, a detector for detecting scattered particles, and a second control electrode for controlling the ion beam, which is directed from the ion source toward a sample, as well as the scattered particles, are arranged on the same axis along with the sample. The ion beam directed from the ion source toward the sample, and the scattered particles, which are scattered from the sample and are directed toward the detector, are caused to converge. By using an Einzel-type lens as the second control electrode, charged particles and neutral particles constituting the scattered particles are provided with a difference in speed. The detector possesses an anode plate which is divided into the form of concentric, circular plates or concentric arc-shaped plates, and each divided anode plate provides a detection output which contains information relating to a distribution of the scattering angles of the scattered ions.
    Type: Grant
    Filed: November 20, 1991
    Date of Patent: November 24, 1992
    Assignees: Shimadzu Corporation, Rikagaku Kenkyuusyo
    Inventors: Shigeki Hayashi, Sumio Kumashiro, Masakazu Aono, Mitsuhiro Katayama