Patents by Inventor Sumit Tandon

Sumit Tandon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220382945
    Abstract: A method and apparatus for estimating signal related delays in a PLD design is disclosed. The PLD design is modeled in relation to one or more stages, each of the stages including a driver and one or more receivers coupled to the driver with a wiring tree. The modeling is based on a selected set of parameters that include: slope related delays associated with the driver; a delay related to a layout of the wiring tree; and a parameter related to a slope transfer from a previous driver input. A predetermined set of values for each of the selected parameters are accessed; the estimated signal related delays are computed for each of the modeled stages; and are written to a computer-readable storage medium.
    Type: Application
    Filed: May 10, 2022
    Publication date: December 1, 2022
    Applicant: Microchip Technology Inc.
    Inventors: Jonathan W. Greene, Gabriel Barajas, Fei Li, Hassan Hassan, James Sumit Tandon
  • Patent number: 9466540
    Abstract: Provided is a detection apparatus that detects process variation in a plurality of comparators that each output a comparison result obtained by comparing a signal level of an input signal to a reference level, the detection apparatus comprising a signal input section that inputs the input signal and the reference level in common to the comparators, and sequentially changes the signal level of the input signal; and a detecting section that detects, for each signal level, a number of comparison results that indicate a predetermined result, from among the comparison results of the comparators, and detects the process variation based on a distribution of the number of comparison results that indicate the predetermined result.
    Type: Grant
    Filed: January 29, 2013
    Date of Patent: October 11, 2016
    Assignees: ADVANTEST CORPORATION, THE UNIVERSITY OF TOKYO
    Inventors: Takahiro Yamaguchi, Satoshi Komatsu, Kunihiro Asada, James Sumit Tandon
  • Patent number: 9057745
    Abstract: Provided is a measurement apparatus that measures an input signal, comprising a plurality of first comparators that each receive the input signal, have a common first reference level set therein, and compare a signal level of the input signal to the first reference level; and a level-crossing timing detecting section that detects a level-crossing timing at which the signal level crosses the first reference level, based on comparison results of the first comparators.
    Type: Grant
    Filed: January 22, 2013
    Date of Patent: June 16, 2015
    Assignees: ADVANTEST CORPORATION, The University of Tokyo
    Inventors: Takahiro Yamaguchi, Satoshi Komatsu, Kunihiro Asada, James Sumit Tandon
  • Publication number: 20140197846
    Abstract: Provided is a detection apparatus that detects process variation in a plurality of comparators that each output a comparison result obtained by comparing a signal level of an input signal to a reference level, the detection apparatus comprising a signal input section that inputs the input signal and the reference level in common to the comparators, and sequentially changes the signal level of the input signal; and a detecting section that detects, for each signal level, a number of comparison results that indicate a predetermined result, from among the comparison results of the comparators, and detects the process variation based on a distribution of the number of comparison results that indicate the predetermined result.
    Type: Application
    Filed: January 29, 2013
    Publication date: July 17, 2014
    Applicants: THE UNIVERSITY OF TOKYO, ADVANTEST CORPORATION
    Inventors: Takahiro YAMAGUCHI, Satoshi KOMATSU, Kunihiro ASADA, James Sumit TANDON
  • Publication number: 20140184194
    Abstract: Provided is a measurement apparatus that measures an input signal, comprising a plurality of first comparators that each receive the input signal, have a common first reference level set therein, and compare a signal level of the input signal to the first reference level; and a level-crossing timing detecting section that detects a level-crossing timing at which the signal level crosses the first reference level, based on comparison results of the first comparators.
    Type: Application
    Filed: January 22, 2013
    Publication date: July 3, 2014
    Applicants: THE UNIVERSITY OF TOKYO, ADVANTEST CORPORATION
    Inventors: Takahiro YAMAGUCHI, Satoshi KOMATSU, Kunihiro ASADA, James Sumit TANDON
  • Patent number: D825865
    Type: Grant
    Filed: October 20, 2016
    Date of Patent: August 14, 2018
    Assignee: Loving Pets Corporation
    Inventors: Eric Abbey, Sumit Tandon