Patents by Inventor Sung-Boem PARK

Sung-Boem PARK has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11216385
    Abstract: Memory management unit (MMU) in an application processor responds to an access request, corresponding to inspection request, including target context and target virtual address and the inspection request is for translating the target virtual address to a first target physical address. The MMU includes context cache, translation cache, invalidation queue and address translation manager (ATM). The context cache stores contexts and context identifiers of the stored contexts, while avoiding duplicating contexts. The translation cache stores first address and first context identifiers second addresses, the first address corresponds to virtual address, the first context identifiers corresponds to first context, and the second addresses corresponds to the first address and the first context. The invalidation queue stores at least one context identifier to be invalidated, of the context identifiers stored in the translation cache. The ATM controls the context cache, the translation cache and the invalidation queue.
    Type: Grant
    Filed: May 15, 2019
    Date of Patent: January 4, 2022
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sung-Boem Park, Moinul Syed, Ju-Hee Choi
  • Patent number: 11210232
    Abstract: A processor includes a page table walk cache that stores address translation information, and a page table walker. The page table walker fetches first output addresses indicated by first indexes of a first input address by looking up the address translation information and at least a part of page tables, and compares a matching level between second indexes of a second input address and the first indexes of the first input address with a walk cache hit level obtained by looking up the page table walk cache using the second indexes.
    Type: Grant
    Filed: September 5, 2019
    Date of Patent: December 28, 2021
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Sung-Boem Park, Moinul Syed, Ju-Hee Choi
  • Patent number: 10983887
    Abstract: A method, apparatus and computer program product to be employed by a hardware component under validation, wherein the hardware component having a plurality of processing units each belonging to one of at least two types, such that one of the at least two types of processing units is less error-prone then a remainder of the at least two types. The method comprising: designating one of the processing units of the hardware component under validation that belongs to the less error-prone type as a manager processing unit; initiating execution of a tester program code for testing processing units, by processing units of the hardware component other than the manager processing unit; and, monitoring by the manager processing unit the status of the processing units during execution of the tester program code.
    Type: Grant
    Filed: December 6, 2019
    Date of Patent: April 20, 2021
    Assignees: INTERNATIONAL BUSINESS MACHINES CORPORATION, SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sung-Boem Park, Amir Nahir, Vitali Sokhin, Wisam Kadry, Jin Sung Park, Ara Cho
  • Publication number: 20200364152
    Abstract: Memory management unit (MMU) in an application processor responds to an access request, corresponding to inspection request, including target context and target virtual address and the inspection request is for translating the target virtual address to a first target physical address. The MMU includes context cache, translation cache, invalidation queue and address translation manager (ATM). The context cache stores contexts and context identifiers of the stored contexts, while avoiding duplicating contexts. The translation cache stores first address and first context identifiers second addresses, the first address corresponds to virtual address, the first context identifiers corresponds to first context, and the second addresses corresponds to the first address and the first context. The invalidation queue stores at least one context identifier to be invalidated, of the context identifiers stored in the translation cache. The ATM controls the context cache, the translation cache and the invalidation queue.
    Type: Application
    Filed: May 15, 2019
    Publication date: November 19, 2020
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Sung-Boem PARK, Moinul SYED, Ju-Hee CHOI
  • Publication number: 20200257635
    Abstract: A processor includes a page table walk cache that stores address translation information, and a page table walker. The page table walker fetches first output addresses indicated by first indexes of a first input address by looking up the address translation information and at least a part of page tables, and compares a matching level between second indexes of a second input address and the first indexes of the first input address with a walk cache hit level obtained by looking up the page table walk cache using the second indexes.
    Type: Application
    Filed: September 5, 2019
    Publication date: August 13, 2020
    Inventors: SUNG-BOEM PARK, MOINUL SYED, JU-HEE CHOI
  • Publication number: 20200151074
    Abstract: A method, apparatus and computer program product to be employed by a hardware component under validation, wherein the hardware component having a plurality of processing units each belonging to one of at least two types, such that one of the at least two types of processing units is less error-prone then a remainder of the at least two types. The method comprising: designating one of the processing units of the hardware component under validation that belongs to the less error-prone type as a manager processing unit; initiating execution of a tester program code for testing processing units, by processing units of the hardware component other than the manager processing unit; and, monitoring by the manager processing unit the status of the processing units during execution of the tester program code.
    Type: Application
    Filed: December 6, 2019
    Publication date: May 14, 2020
    Inventors: Sung-Boem Park, Amir Nahir, Vitali Sokhin, Wisam Kadry, Jin Sung Park, Ara Cho
  • Patent number: 10528443
    Abstract: A method, apparatus and computer program product to be employed by a hardware component under validation, wherein the hardware component having a plurality of processing units each belonging to one of at least two types, such that one of the at least two types of processing units is less error-prone than a remainder of the at least two types. The method comprising: designating one of the processing units of the hardware component under validation that belongs to the less error-prone type as a manager processing unit; initiating execution of a tester program code for testing processing units, by processing units of the hardware component other than the manager processing unit; and, monitoring by the manager processing unit the status of the processing units during execution of the tester program code.
    Type: Grant
    Filed: January 30, 2015
    Date of Patent: January 7, 2020
    Assignees: SAMSUNG ELECTRONICS CO., LTD., INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Sung-Boem Park, Amir Nahir, Vitali Sokhin, Wisam Kadry, Jin Sung Park, Ara Cho
  • Patent number: 9990205
    Abstract: A verification method of a system on chip includes receiving a test generator and an exception handler; generating, by the test generator, a test program including an exception-causing instruction based on a test template; executing a first instruction at a first operating state as the test program is executed; stopping the execution of the test program and performing a fixed instruction sequence included in the exception handler when the exception-causing instruction is executed during the execution of the test program; and resuming the test program from a second instruction at a second operating state set after the fixed instruction sequence is performed, the second instruction corresponding to an address adjacent to an address of the exception-causing instruction.
    Type: Grant
    Filed: September 6, 2016
    Date of Patent: June 5, 2018
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Sung-Boem Park, Jin-Sung Park, Ara Cho
  • Patent number: 9626267
    Abstract: A method, apparatus and product for test generation. The method comprises generating a first set of instructions for a hardware component, that are to be executed when operating in a first mode of operation; in response to a parsed template statement being a marker statement, generating an intermediary set of one or more instructions to cause the hardware component to change the mode of operation to a second mode in accordance with the marker instruction, and modifying the expected mode of the hardware component to a second mode; and generating a second set of instructions for the hardware component, that are to be executed when operating in the second mode of operation. The generation of instructions comprises determining the expected mode and generating instructions in accordance with the expected mode of the hardware component. The generation is performed without having an expected full state of the hardware component.
    Type: Grant
    Filed: January 30, 2015
    Date of Patent: April 18, 2017
    Assignee: International Business Machines Corporation
    Inventors: Sung-Boem Park, Amir Nahir, Vitali Sokhin, Wisam Kadry, Jin Sung Park, Ara Cho
  • Publication number: 20160371092
    Abstract: A verification method of a system on chip includes receiving a test generator and an exception handler; generating, by the test generator, a test program including an exception-causing instruction based on a test template; executing a first instruction at a first operating state as the test program is executed; stopping the execution of the test program and performing a fixed instruction sequence included in the exception handler when the exception-causing instruction is executed during the execution of the test program; and resuming the test program from a second instruction at a second operating state set after the fixed instruction sequence is performed, the second instruction corresponding to an address adjacent to an address of the exception-causing instruction.
    Type: Application
    Filed: September 6, 2016
    Publication date: December 22, 2016
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Sung-Boem PARK, Jin-Sung PARK, Ara CHO
  • Patent number: 9448917
    Abstract: A verification method of a system on chip includes receiving a test generator and an exception handler; generating, by the test generator, a test program including an exception-causing instruction based on a test template; executing a first instruction at a first operating state as the test program is executed; stopping the execution of the test program and performing a fixed instruction sequence included in the exception handler when the exception-causing instruction is executed during the execution of the test program; and resuming the test program from a second instruction at a second operating state set after the fixed instruction sequence is performed, the second instruction corresponding to an address adjacent to an address of the exception-causing instruction.
    Type: Grant
    Filed: April 7, 2015
    Date of Patent: September 20, 2016
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Sung-Boem Park, Jin-Sung Park, Ara Cho
  • Publication number: 20160224452
    Abstract: A method, apparatus and computer program product to be employed by a hardware component under validation, wherein the hardware component having a plurality of processing units each belonging to one of at least two types, such that one of the at least two types of processing units is less error-prone then a remainder of the at least two types. The method comprising: designating one of the processing units of the hardware component under validation that belongs to the less error-prone type as a manager processing unit; initiating execution of a tester program code for testing processing units, by processing units of the hardware component other than the manager processing unit; and, monitoring by the manager processing unit the status of the processing units during execution of the tester program code.
    Type: Application
    Filed: January 30, 2015
    Publication date: August 4, 2016
    Inventors: Sung-Boem Park, Amir Nahir, Vitali Sokhin, Wisam Kadry, Jin Sung Park, Ara Cho
  • Publication number: 20160224448
    Abstract: A method, apparatus and product for test generation. The method comprises generating a first set of instructions for a hardware component, that are to be executed when operating in a first mode of operation; in response to a parsed template statement being a marker statement, generating an intermediary set of one or more instructions to cause the hardware component to change the mode of operation to a second mode in accordance with the marker instruction, and modifying the expected mode of the hardware component to a second mode; and generating a second set of instructions for the hardware component, that are to be executed when operating in the second mode of operation. The generation of instructions comprises determining the expected mode and generating instructions in accordance with the expected mode of the hardware component. The generation is performed without having an expected full state of the hardware component.
    Type: Application
    Filed: January 30, 2015
    Publication date: August 4, 2016
    Inventors: Sung-Boem Park, Amir Nahir, Vitali Sokhin, Wisam Kadry, Jin Sung Park, Ara Cho
  • Publication number: 20150293835
    Abstract: A verification method of a system on chip includes receiving a test generator and an exception handler; generating, by the test generator, a test program including an exception-causing instruction based on a test template; executing a first instruction at a first operating state as the test program is executed; stopping the execution of the test program and performing a fixed instruction sequence included in the exception handler when the exception-causing instruction is executed during the execution of the test program; and resuming the test program from a second instruction at a second operating state set after the fixed instruction sequence is performed, the second instruction corresponding to an address adjacent to an address of the exception-causing instruction.
    Type: Application
    Filed: April 7, 2015
    Publication date: October 15, 2015
    Inventors: Sung-Boem PARK, Jin-Sung PARK, Ara CHO