Patents by Inventor Sung-Eun YUN

Sung-Eun YUN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Memory card
    Patent number: 9183950
    Abstract: A memory card includes a memory cell, a connector, a controller, and firmware. The memory cell can switch between a plurality of states. The connector can be connected to an external device and exchange signals including commands and data with the external device. The controller exchanges signals with the connector, analyzes a received signal, and accesses the memory cell to record, retrieve or modify data based on the analysis result. The firmware is located within the controller, controls the operation of the controller, and can be set to a test mode or a user mode. When the firmware receives a test command from the external device and the firmware is set to the test mode, the firmware performs a defect test on the memory cell and transmits the result of the defect test to the external device through the connector.
    Type: Grant
    Filed: May 28, 2014
    Date of Patent: November 10, 2015
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Yun-Bo Yang, Young-Jae Jung, Kui-Hyun Ro, Sung-Eun Yun
  • MEMORY CARD
    Publication number: 20140281765
    Abstract: A memory card includes a memory cell, a connector, a controller, and firmware. The memory cell can switch between a plurality of states. The connector can be connected to an external device and exchange signals including commands and data with the external device. The controller exchanges signals with the connector, analyzes a received signal, and accesses the memory cell to record, retrieve or modify data based on the analysis result. The firmware is located within the controller, controls the operation of the controller, and can be set to a test mode or a user mode. When the firmware receives a test command from the external device and the firmware is set to the test mode, the firmware performs a defect test on the memory cell and transmits the result of the defect test to the external device through the connector.
    Type: Application
    Filed: May 28, 2014
    Publication date: September 18, 2014
    Inventors: Yun-Bo Yang, Young-Jae Jung, Kui-Hyun Ro, Sung-Eun Yun
  • Memory card
    Patent number: 8769353
    Abstract: A memory card includes a memory cell, a connector, a controller, and firmware. The memory cell can switch between a plurality of states. The connector can be connected to an external device and exchange signals including commands and data with the external device. The controller exchanges signals with the connector, analyzes a received signal, and accesses the memory cell to record, retrieve or modify data based on the analysis result. The firmware is located within the controller, controls the operation of the controller, and can be set to a test mode or a user mode. When the firmware receives a test command from the external device and the firmware is set to the test mode, the firmware performs a defect test on the memory cell and transmits the result of the defect test to the external device through the connector.
    Type: Grant
    Filed: September 7, 2011
    Date of Patent: July 1, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Yun-Bo Yang, Young-Jae Jung, Kui-Hyun Ro, Sung-Eun Yun
  • MEMORY CARD
    Publication number: 20120117430
    Abstract: A memory card includes a memory cell, a connector, a controller, and firmware. The memory cell can switch between a plurality of states. The connector can be connected to an external device and exchange signals including commands and data with the external device. The controller exchanges signals with the connector, analyzes a received signal, and accesses the memory cell to record, retrieve or modify data based on the analysis result. The firmware is located within the controller, controls the operation of the controller, and can be set to a test mode or a user mode. When the firmware receives a test command from the external device and the firmware is set to the test mode, the firmware performs a defect test on the memory cell and transmits the result of the defect test to the external device through the connector.
    Type: Application
    Filed: September 7, 2011
    Publication date: May 10, 2012
    Inventors: Yun-Bo YANG, Young-Jae JUNG, Kui-Hyun RO, Sung-Eun YUN