Patents by Inventor Sung-Mok Kwag

Sung-Mok Kwag has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7289413
    Abstract: In a data slicer and data slicing method for an optical disc system, the data slicer for converting an analog input signal into a digital signal includes a comparator, a duty detector, and a low pass filter. The comparator compares the analog input signal with a feedback signal to generate the digital signal. The duty detector detects the duty of the digital signal. If the detected duty is longer than a preset duration, the duty detector converts the detected signal into a signal having the preset duration, and outputs the converted signal. The low pass filter integrates the output signal of the duty detector to generate the feedback signal.
    Type: Grant
    Filed: August 12, 2003
    Date of Patent: October 30, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Sung-mok Kwag, Tae-hyeon Sim
  • Publication number: 20040042368
    Abstract: In a data slicer and data slicing method for an optical disc system, the data slicer for converting an analog input signal into a digital signal includes a comparator, a duty detector, and a low pass filter. The comparator compares the analog input signal with a feedback signal to generate the digital signal. The duty detector detects the duty of the digital signal. If the detected duty is longer than a preset duration, the duty detector converts the detected signal into a signal having the preset duration, and outputs the converted signal. The low pass filter integrates the output signal of the duty detector to generate the feedback signal.
    Type: Application
    Filed: August 12, 2003
    Publication date: March 4, 2004
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Sung-mok Kwag, Tae-hyeon Sim
  • Patent number: 6259664
    Abstract: A defect detection circuit and method for detecting disk defects in an optical disc data reproduction system allows for correct detection of defects not only during operation in a constant linear velocity mode but also during operation in a constant angular velocity mode using a channel bit clock signal as a reference signal. The circuit includes a comparator for comparing an RF signal with a first compare voltage having a predetermined voltage level and a second compare voltage having a voltage level lower than the first compare voltage, and for generating a first comparison signal activated in response to the RF signal having a level higher than that of the first compare voltage and a second comparison signal activated in response to the RF signal having a voltage level lower than that of the second compare voltage.
    Type: Grant
    Filed: May 21, 1999
    Date of Patent: July 10, 2001
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Sung-Mok Kwag