Abstract: A semiconductor device includes a driving signal generation unit configured to selectively drive a sub word line driving signal in response to a sub word line select signal. The semiconductor device also includes a sub word line driving unit configured to drive a sub word line in response to a main word line select signal and the sub word line driving signal. Further, the semiconductor device includes leakage path blocking unit configured to block a leakage path formed from the sub word line through the driving signal generation unit, in response to a test signal.

Abstract: A semiconductor device includes a driving signal generation unit configured to selectively drive a sub word line driving signal in response to a sub word line select signal. The semiconductor device also includes a sub word line driving unit configured to drive a sub word line in response to a main word line select signal and the sub word line driving signal. Further, the semiconductor device includes leakage path blocking unit configured to block a leakage path formed from the sub word line through the driving signal generation unit, in response to a test signal.

Abstract: A semiconductor memory device includes a voltage control circuit providing different voltages as a precharge voltage in accordance with an active state and a standby stage. The semiconductor memory device is arranged in a peripheral region, whereby the different voltages can be provided as a precharge voltage in accordance with the active state and the standby state and thus leakage current is reduced and area efficiency is enhanced.

Abstract: A leakage current control device of a semiconductor memory device is provided to effectively remove leakage current flowing from a bit line to a word line when a process defect is generated by gate residues of the semiconductor memory device, thereby reducing unnecessary current consumption. In the leakage current control device, the bit line boosted to a voltage level of core voltage/2 is controlled at a ground voltage level during a precharge period to remove unnecessary leakage current flowing from the bit line to a word line bridge.

Abstract: A sense amplifier overdriving circuit includes a first voltage driver which supplies an internal voltage from an internal voltage terminal to a sense amplifier in response to a first enabling signal, a logic unit which logically operates a block select signal for selection of a cell block and a second enabling signal enabled for a predetermined time after enabling of the first enabling signal, and outputs the resultant signal, and a second voltage driver which supplies an external voltage to the internal voltage terminal in response to the signal output from the logic unit.

Abstract: A sense amplifier overdriving circuit includes a first voltage driver which supplies an internal voltage from an internal voltage terminal to a sense amplifier in response to a first enabling signal, a logic unit which logically operates a block select signal for selection of a cell block and a second enabling signal enabled for a predetermined time after enabling of the first enabling signal, and outputs the resultant signal, and a second voltage driver which supplies an external voltage to the internal voltage terminal in response to the signal output from the logic unit. A semiconductor device using the sense amplifier overdriving circuit is also disclosed.

Abstract: A sense amplifier overdriving circuit includes a first voltage driver which supplies an internal voltage from an internal voltage terminal to a sense amplifier in response to a first enabling signal, a logic unit which logically operates a block select signal for selection of a cell block and a second enabling signal enabled for a predetermined time after enabling of the first enabling signal, and outputs the resultant signal, and a second voltage driver which supplies an external voltage to the internal voltage terminal in response to the signal output from the logic unit. The sensing amplifier overdriving circuit may be used in a semiconductor device.

Abstract: A leakage current control device of a semiconductor memory device is provided to effectively remove leakage current flowing from a bit line to a word line when a process defect is generated by gate residues of the semiconductor memory device, thereby reducing unnecessary current consumption. In the leakage current control device, the bit line boosted to a voltage level of core voltage/2 is controlled at a ground voltage level during a precharge period to remove unnecessary leakage current flowing from the bit line to a word line bridge.

Abstract: The present invention relates to a semiconductor memory device and more particularly there is disclosed a voltage control circuit, a voltage control method and a semiconductor memory device having the voltage control circuit which can reduce leakage currents and improve precharge performance. The present invention includes a voltage control circuit providing different voltages as a precharge voltage in accordance with an active state and a standby stage by arranging the semiconductor memory device in a peripheral region, whereby the different voltages can be provided as a precharge voltage in accordance with the active state and the standby state and thus leakage current is reduced and area efficiency is enhanced.

Abstract: A memory device for multiplexing an input/output operation prevents mis-operations by comparing the input addresses with the output data and improves operating speed by activating data corresponding to the input addresses by input address toggle. The memory device for multiplexing an input/output operation comprises an data output buffer, an address buffer, a comparison unit and a row activation control unit. The comparison unit compares an address outputted from the address buffer to the address bus with data inputted through the output data bus to the data output buffer, and outputs the comparison result. The row activation control unit generates a row active signal for activating a row path in response to the comparison result.