Patents by Inventor Sung-Tek Kahng

Sung-Tek Kahng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10530062
    Abstract: An apparatus to create uniform electric and magnetic-field distribution as zeroth-order resonance in a waveguide and a cavity according to an embodiment of the present invention includes a rectangular waveguide with a rectangular-shaped cross section comprising a cavity in the inside, and a conductive helical wire inserted into the cavity of the waveguide, wherein the main body of the conductive helical wire does not contact the inner surfaces of the waveguide at a predetermined gap, and both ends of the conductive helical wire are short-circuited to the inner surface of the waveguide, so as to create a uniform electric field and magnetic field throughout the entire waveguide.
    Type: Grant
    Filed: November 9, 2016
    Date of Patent: January 7, 2020
    Assignee: INCHEON UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION
    Inventor: Sung Tek Kahng
  • Patent number: 9768505
    Abstract: A multi input multi output (MIMO) antenna with no phase change is provided. The MIMO antenna having no phase change constituting one antenna structure overall, wherein unit structures at both sides are symmetrical to each other in a meander form with respect to the center; the unit structures having the meander form are connected to a ground plate by using as a medium power feeding units 240 and 250 supplying an electric energy to the respective unit structures; and the unit structures are installed with a three-dimensional structure, being adjacent to the ground plate.
    Type: Grant
    Filed: October 10, 2011
    Date of Patent: September 19, 2017
    Assignees: LG INNOTEK CO., LTD., INDUSTRY-ACADEMIC COOPERATION FOUNDATION INCHEON NATIONAL UNIVERSITY
    Inventors: Jeong Hoon Cho, Kyung Suk Kim, Ja Kwon Ku, Sung Tek Kahng, Geon Ho Jang, Seong Ryong Yoo
  • Publication number: 20170194708
    Abstract: An apparatus to create uniform electric and magnetic-field distribution as zeroth-order resonance in a waveguide and a cavity according to an embodiment of the present invention includes a rectangular waveguide with a rectangular-shaped cross section comprising a cavity in the inside, and a conductive helical wire inserted into the cavity of the waveguide, wherein the main body of the conductive helical wire does not contact the inner surfaces of the waveguide at a predetermined gap, and both ends of the conductive helical wire are short-circuited to the inner surface of the waveguide, so as to create a uniform electric field and magnetic field throughout the entire waveguide.
    Type: Application
    Filed: November 9, 2016
    Publication date: July 6, 2017
    Applicant: INCHEON UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION
    Inventor: SUNG TEK KAHNG
  • Publication number: 20140055319
    Abstract: A multi input multi output (MIMO) antenna with no phase change is provided. The MIMO antenna having no phase change constituting one antenna structure overall, wherein unit structures at both sides are symmetrical to each other in a meander form with respect to the center; the unit structures having the meander form are connected to a ground plate by using as a medium power feeding units 240 and 250 supplying an electric energy to the respective unit structures; and the unit structures are installed with a three-dimensional structure, being adjacent to the ground plate.
    Type: Application
    Filed: October 10, 2011
    Publication date: February 27, 2014
    Applicants: INDUSTRY-ACADEMIC COOPERATION FOUNDATION INCHEON NATIONAL UNIVERSITY, LG INNOTEK CO., LTD.
    Inventors: Jeong Hoon Cho, Kyung Suk Kim, Ja Kwon Ku, Sung Tek Kahng, Geon Ho Jang, Seong Ryong Yoo
  • Patent number: 7170300
    Abstract: An apparatus and method for detecting a defect on a ground layer of microstrip by using scattering parameters is disclosed. The apparatus includes: a providing unit for providing a signal to the microstrip by changing a frequency of the signal in a predetermined range of frequencies; a detecting unit for detecting scattering parameters of an output signal from the microstrip in response to the frequency of the signal; and an analyzing unit for analyzing the interface based on the scattering parameters.
    Type: Grant
    Filed: August 12, 2004
    Date of Patent: January 30, 2007
    Assignee: Electronics and Telecommunications Research Institute
    Inventors: Sung-Tek Kahng, Jong-Won Eun, Seong-Pal Lee
  • Patent number: 7002359
    Abstract: An apparatus and a method for measuring an electric magnetic interference (EMI) level of a radio frequency device is disclosed. The apparatus for measuring a level of electric magnetic interference (EMI) with an electronic device to radiate an electromagnetic wave, the apparatus including: a test device for outputting a signal in response to the electromagnetic wave radiated from the electric device; a calculating unit for calculating a group_delay variation information of the test device by using the signal from the test device; a processor for storing a reference group_delay variation; and an analyzer for analyzing the level of EMI by comparing the reference group_delay variation information and the group_delay variation information.
    Type: Grant
    Filed: April 21, 2004
    Date of Patent: February 21, 2006
    Assignee: Electronics and Telecommunications Research Institute
    Inventors: Sung-Tek Kahng, Jong-Won Eun, Seong-Pal Lee
  • Publication number: 20050134291
    Abstract: An apparatus and a method for measuring an electric magnetic interference (EMI) level of a radio frequency device is disclosed. The apparatus for measuring a level of electric magnetic interference (EMI) with an electronic device to radiate an electromagnetic wave, the apparatus including: a test device for outputting a signal in response to the electromagnetic wave radiated from the electric device; a calculating unit for calculating a group_delay variation information of the test device by using the signal from the test device; a processor for storing a reference group_delay variation; and an analyzer for analyzing the level of EMI by comparing the reference group_delay variation information and the group_delay variation information.
    Type: Application
    Filed: April 21, 2004
    Publication date: June 23, 2005
    Inventors: Sung-Tek Kahng, Jong-Won Eun, Seong-Pal Lee
  • Publication number: 20050127892
    Abstract: An apparatus and method for detecting a defect on a ground layer of microstrip by using scattering parameters is disclosed. The apparatus includes: a providing unit for providing a signal to the microstrip by changing a frequency of the signal in a predetermined range of frequencies; a detecting unit for detecting scattering parameters of an output signal from the microstrip in response to the frequency of the signal; and an analyzing unit for analyzing the interface based on the scattering parameters.
    Type: Application
    Filed: August 12, 2004
    Publication date: June 16, 2005
    Inventors: Sung-Tek Kahng, Jong-Won Eun, Seong-Pal Lee